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	<title>Test and Measurement Tips</title>
	
	<link>http://www.testandmeasurementtips.com</link>
	<description>Tips, trends, techniques for Tests &amp; Measurements</description>
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		<title>Data Acquisition Output Modules Have USB-Based DAQ &amp; Control</title>
		<link>http://feedproxy.google.com/~r/TestAndMeasurementTips/~3/nbiUDHnd6wk/</link>
		<comments>http://www.testandmeasurementtips.com/calibration/data-acquisition/data-acquisition-output-modules-have-usb-based-daq-control/#comments</comments>
		<pubDate>Tue, 09 Mar 2010 21:35:50 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Data Acquisition]]></category>
		<category><![CDATA[accesio]]></category>
		<category><![CDATA[analog output channels]]></category>
		<category><![CDATA[analog outputs]]></category>

		<guid isPermaLink="false">http://www.testandmeasurementtips.com/?p=1500</guid>
		<description><![CDATA[ACCES I/O Products, Inc. announces the latest  addition to its extensive line of small form factor USB-based data  acquisition and control I/O modules-the USB-AO Series. This innovative  line of 12 and 16-bit USB modules will be showcased at the upcoming  Embedded Systems Conference in San Jose. Starting with its flagship  [...]]]></description>
			<content:encoded><![CDATA[<p><img class="alignright size-full wp-image-1501" title="output module" src="http://www.testandmeasurementtips.com/wp-content/uploads/2010/03/output-module.jpg" alt="output module with USB ports" width="196" height="196" />ACCES I/O Products, Inc. announces the latest  addition to its extensive line of small form factor USB-based data  acquisition and control I/O modules-the USB-AO Series. This innovative  line of 12 and 16-bit USB modules will be showcased at the upcoming  Embedded Systems Conference in San Jose. Starting with its flagship  model, the USB-AO16-16A, this high speed USB 2.0, multifunction board  features 16 channels of 16-bit resolution analog outputs along with two  16-bit analog inputs and 16 digital I/O lines-all packaged in a small,  rugged, industrial enclosure. This module can be used in any PC or  embedded system with a USB port and is an ideal choice for embedded  system and test designers. The USB-AO16-16A can be used in an assortment  of USB-based embedded applications which require stable and accurate  output signals. Ideal applications include light control, motion  control, and process controls.</p>
<p>The USB-AO Series includes 10 models with list prices ranging from $299  to $699, an unprecedented value. The boards features both unipolar and  bipolar output ranges. Additional specific ranges can be achieved as  factory options. All analog output channels can be updated either  individually or simultaneously. System calibration specific to user  requirements can be performed via a provided, easy-to-use, software  utility. Automatic circuits limit analog outputs to zero volts until  initialized via software command.</p>
<p>A micro-fit USB header connector is provided in parallel with the high  retention type B connector and can be used for stacking and embedded  applications. Available accessories include a wide variety of cables and  screw terminal boards for quick and easy connectivity.</p>
<p>Key features of the USB-AO Series include:</p>
<p>o	Up to 16 analog outputs with 12 or 16-bit resolution</p>
<p>o	High-speed USB 2.0 device, USB 1.1 compatible</p>
<p>o	Unipolar and bipolar output ranges</p>
<p>o	Real-time hardware calibration per channel</p>
<p>o	Update outputs individually or simultaneously</p>
<p>o	Two 16-bit analog inputs and 16 lines of digital I/O</p>
<p>o	All digital I/O lines buffered with 10mA source, 24mA sink current  capabilities</p>
<p>o	USB/104 form-factor for OEM embedded applications</p>
<p>o	OEM version (board only) features PC/104 module size and mounting  compatibility</p>
<p>o	Alternate micro-fit embedded USB header connector</p>
<p>o	Type B USB connector features industrial strength and high-retention  design</p>
<p>o	Extended operating temperature and DIN rail mounting provisions</p>
<p>o	Small, (4&#8243; x 4&#8243; x 1.25&#8243;) rugged, steel industrial enclosure</p>
<p>o	Eight or four channel versions available</p>
<p>The USB-AO Series was designed to be used in rugged industrial  environments but is small enough to fit nicely onto any desk or testing  station. The board measures just 3.550 by 3.775 inches and ships inside a  steel powder-coated enclosure with an anti-skid bottom. A DIN rail  mounting provision is available for installation in industrial  environments. What makes the OEM USB/104 option unique is that its PCB  size and pre-drilled mounting holes match the PC/104 form factor  (without the bus connections). This ensures easy installation using  standard standoffs inside most embedded enclosures or systems. The  USB-AO Series can be integrated into any PC/104-based stack by simply  connecting it to a USB port included on-board with embedded CPU form  factors such as EBX, EPIC, and PC/104.</p>
<p>The USB-AO Series utilizes a high-speed custom function driver optimized  for a maximum data throughput that is 50-100 times faster than the USB  human interface device (HID) driver used by many competing products.  This approach maximizes the full functionality of the hardware along  with capitalizing the advantage of high-speed USB 2.0.</p>
<p>The USB-AO Series is supported for use in most operating systems and  includes a free Linux (including Mac OS X) and Windows  2000/XP/2003/Vista/7 compatible software package. This package contains  sample programs and source code in Visual Basic, Delphi, and Visual C++  for Windows. Also provided is a graphical setup program in Windows.  Third party support includes a Windows standard DLL interface usable  from the most popular application programs, and includes LabVIEW VIs.  Embedded OS support includes Windows Xpe.</p>
<p><a href="http://www.accesio.com/" target="_blank">www.accesio.com</a></p>
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		<item>
		<title>Surface Roughness Tester For Manual Testing</title>
		<link>http://feedproxy.google.com/~r/TestAndMeasurementTips/~3/lx3W-BMrX3Y/</link>
		<comments>http://www.testandmeasurementtips.com/calibration/data-acquisition/surface-roughness-tester-for-manual-testing/#comments</comments>
		<pubDate>Tue, 02 Mar 2010 21:18:30 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Data Acquisition]]></category>
		<category><![CDATA[Meters & Testers]]></category>
		<category><![CDATA[Test Equipment]]></category>
		<category><![CDATA[mitutoyo america corporation]]></category>
		<category><![CDATA[screen capture]]></category>
		<category><![CDATA[surface detection]]></category>

		<guid isPermaLink="false">http://www.testandmeasurementtips.com/?p=1490</guid>
		<description><![CDATA[Mitutoyo America Corporation announces the new  Surftest® SJ-210 portable surface roughness tester. Numerous innovative  features combined with high accuracy and a competitive price makes this  instrument the new class leader.
The Surftest SJ-210&#8217;s large, 2.4&#8243; color LCD display includes  backlighting, over-size fonts and the unique ability to re-orient screen  content to [...]]]></description>
			<content:encoded><![CDATA[<p><img class="alignright size-full wp-image-1491" title="surface tester" src="http://www.testandmeasurementtips.com/wp-content/uploads/2010/03/surface-tester.jpg" alt="portable surface roughness tester" width="200" height="183" />Mitutoyo America Corporation announces the new  Surftest® SJ-210 portable surface roughness tester. Numerous innovative  features combined with high accuracy and a competitive price makes this  instrument the new class leader.</p>
<p>The Surftest SJ-210&#8217;s large, 2.4&#8243; color LCD display includes  backlighting, over-size fonts and the unique ability to re-orient screen  content to be read vertically or horizontally left and right-handed.  Color tolerance judgments, evaluation curves and all data can be  displayed in one of 16 languages. Self-timed measurement and optional  foot switch facilitate smooth, consistent operation. Up to ten  measurement conditions can be registered and the ten most recent trace  results are stored automatically. The SJ-210 employs a micro-SD card for  storage of up to 10,000 results and support of screen capture. USB and  RS-232C connectivity is supported. Security is managed via a password  lock.</p>
<p>With high accuracy (a resolution of 0.0016µm at a measurement range of 25µm), a fast measurement speed (up to a max. of 0.75mm/s), a selection  of nine exchangeable detector tips and features such as gear tooth  surface detection, the Surftest SJ-210&#8217;s flexibility and high throughput  make it ideal for any manual surface roughness inspection task.</p>
<p><a href="http://www.mitutoyo.com/" target="_blank">www.mitutoyo.com</a></p>
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		<item>
		<title>Freeman Tech. Has New Reference Standard For Powder Tester</title>
		<link>http://feedproxy.google.com/~r/TestAndMeasurementTips/~3/8lSzCmY5Os8/</link>
		<comments>http://www.testandmeasurementtips.com/test-equipment/freeman-tech-has-new-reference-standard-for-powder-tester/#comments</comments>
		<pubDate>Thu, 25 Feb 2010 21:51:18 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Meters & Testers]]></category>
		<category><![CDATA[Test Equipment]]></category>
		<category><![CDATA[freeman]]></category>
		<category><![CDATA[powder tester]]></category>
		<category><![CDATA[test methodologies]]></category>

		<guid isPermaLink="false">http://www.testandmeasurementtips.com/?p=1484</guid>
		<description><![CDATA[Freeman Technology will present a new reference  standard for use with the company&#8217;s FT4 powder tester. The FT4 uses  patented dynamic methodology, a fully automated shear cell and several  bulk property tests, including density, compressibility and permeability  to quantify powder properties in terms of flow and processability. In  combination with [...]]]></description>
			<content:encoded><![CDATA[<p><img class="alignleft size-full wp-image-1485" title="powder tester" src="http://www.testandmeasurementtips.com/wp-content/uploads/2010/02/powder-tester.jpg" alt="Powder tester sets a new reference standard" width="250" height="295" />Freeman Technology will present a new reference  standard for use with the company&#8217;s FT4 powder tester. The FT4 uses  patented dynamic methodology, a fully automated shear cell and several  bulk property tests, including density, compressibility and permeability  to quantify powder properties in terms of flow and processability. In  combination with defined test methodologies, the new reference standard,  a stable fine limestone (CRM116/BCR116), enables users to verify the  long term performance of the FT4 in line with their own laboratory  practices.</p>
<p>CRM116/BCR116 is a limestone supplied by the EU Institute for Reference  Materials and Measurements, for which there already exists calibration  data for shear testing. Test protocols and acceptable results ranges for  dynamic, shear and bulk property measurement (compressibility and  permeability) have now also been established. Testing the performance of  the FT4 is simply a matter of running the automated test sequence and  comparing the data generated.</p>
<p>The CRM116 limestone is a cohesive powder with a mean diameter of around  four microns. Although normally available in three kilogram batches  Freeman Technology will supply much smaller aliquots for routine  calibration.</p>
<p><a href="http://www.freemantech.co.uk/" target="_blank">www.freemantech.co.uk</a></p>
<img src="http://feeds.feedburner.com/~r/TestAndMeasurementTips/~4/8lSzCmY5Os8" height="1" width="1"/>]]></content:encoded>
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		<title>Optical PV Cell Testing System Provides Non-Destructive Analysis</title>
		<link>http://feedproxy.google.com/~r/TestAndMeasurementTips/~3/sSidbqv4UTQ/</link>
		<comments>http://www.testandmeasurementtips.com/sensing/machine-visioninspection/optical-pv-cell-testing-system-provides-non-destructive-analysis/#comments</comments>
		<pubDate>Thu, 25 Feb 2010 21:30:33 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Featured]]></category>
		<category><![CDATA[Machine Vision/Inspection]]></category>
		<category><![CDATA[Meters & Testers]]></category>
		<category><![CDATA[Sensing]]></category>
		<category><![CDATA[Test Equipment]]></category>
		<category><![CDATA[craic]]></category>
		<category><![CDATA[flexible instrument]]></category>
		<category><![CDATA[thin film measurement]]></category>

		<guid isPermaLink="false">http://www.testandmeasurementtips.com/?p=1481</guid>
		<description><![CDATA[CRAIC Technologies released the  20/20(TM)  UV-visible-NIR microspectrophotometer.  20/20(TM) microspectrophotometer  is  designed to non-destructively analyze many types of microscopic  samples  from the deep ultraviolet to the near infrared. Analysis of  samples can  be done by absorbance, reflectance, luminescence and  fluorescence with  unparalleled speed and accuracy. The [...]]]></description>
			<content:encoded><![CDATA[<p><a href="http://solarpowerengineering.com/wp-content/uploads/2010/02/Craic-microscope.jpg"><img class="alignright" title="Craic microscope" src="http://solarpowerengineering.com/wp-content/uploads/2010/02/Craic-microscope.jpg" alt="This Microspectrophotometer looks very similar to a Microscope" width="300" height="367" /></a>CRAIC Technologies released the  20/20(TM)  UV-visible-NIR microspectrophotometer.  20/20(TM) microspectrophotometer  is  designed to non-destructively analyze many types of microscopic  samples  from the deep ultraviolet to the near infrared. Analysis of  samples can  be done by absorbance, reflectance, luminescence and  fluorescence with  unparalleled speed and accuracy. The system can also  be configured to  image microscopic samples in the UV and NIR regions in  addition to color  imaging.</p>
<p>Applications are numerous and include forensic analysis of trace   evidence, vitrinite reflectance of coal and spectral analysis of   minerals, measurement of protein crystals, contamination analysis and   thin film measurement of semiconductors, hard disks and flat panel   displays.</p>
<p>The 20/20(TM) microspectrophotometer integrates an advanced   spectrophotometer with a sophisticated UV-visible-NIR range microscope   and powerful, easy-to-use software. This flexible instrument is designed   to acquire data from microscopic samples by absorbance, reflectance or   even luminescence spectroscopy. By including high-resolution digital   imaging, the user is also able to use the instrument as a ultraviolet or   infrared microscope. Touch screen controls, sophisticated software,   calibrated variable apertures and other innovations all point to a new   level of sophistication for microanalysis.</p>
<p><a href="http://www.microspectra.com/index.php" target="_blank">www.microspectra.com</a></p>
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		<item>
		<title>ABLE Gas Flow Meter Helps Extend Life of North Sea Asset</title>
		<link>http://feedproxy.google.com/~r/TestAndMeasurementTips/~3/f5Uxbo4VFZQ/</link>
		<comments>http://www.testandmeasurementtips.com/meters-testers/able-gas-flow-meter-helps-extend-life-of-north-sea-asset/#comments</comments>
		<pubDate>Thu, 18 Feb 2010 23:09:54 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Meters & Testers]]></category>
		<category><![CDATA[able]]></category>
		<category><![CDATA[gas flow meter]]></category>
		<category><![CDATA[wellhead]]></category>

		<guid isPermaLink="false">http://www.testandmeasurementtips.com/?p=1477</guid>
		<description><![CDATA[As the gas producing wells in North Sea decline, the available  wellhead pressures drop. This mostly affects the operation of process  equipment such as Amine coolers which need high gas pressure for  efficient operation.
As a consequence, compressor modifications, generally utilizing  a rerouted existing export compressor to become an LP compressor to [...]]]></description>
			<content:encoded><![CDATA[<p><img class="alignleft size-full wp-image-1478" title="low-pressure gas flow meter" src="http://www.testandmeasurementtips.com/wp-content/uploads/2010/02/low-pressure-gas-flow-meter.jpg" alt="meter to measure low-pressure in the North Sea" width="250" height="250" />As the gas producing wells in North Sea decline, the available  wellhead pressures drop. This mostly affects the operation of process  equipment such as Amine coolers which need high gas pressure for  efficient operation.</p>
<p>As a consequence, compressor modifications, generally utilizing  a rerouted existing export compressor to become an LP compressor to  boost the incoming gas pressure, are being implemented. This is an  effective solution that has the potential to significantly extend the  life of the asset.</p>
<p>With this modified configuration, it is vital to ensure that  the LP compressor does not run ineffectively in full recycle, yet many  assets were never designed to include metering of the discharge flows  built in to the compressor discharge pipework.</p>
<p>Without this key metering facility it is difficult to determine  the actual discharge flow from the LP compressor and the associated  efficiency. Relying on pressure control valve positions and other  unconventional flow techniques to infer flow is not acceptable.</p>
<p>On initial commissioning, the flow can be obtained using a control  algorithm, based on the flow characteristics of the recycle valve but as  the valve wears, this method of measurement becomes more unreliable  with time. The solution is to use a non-intrusive gas meter that can be  installed without piping modifications or loss of production. This  greatly reduces the cost of implementation and eliminates any equipment  integrity issues, resulting in no risk of loss of containment or  hydrocarbon release issues.</p>
<p>ABLE Instruments has successfully provided a clamp on  Ultrasonic gas meter solution for this application with proven excellent  accuracy and reliability, which has greatly assisted with the smooth  implementation of compressor reconfiguration projects.</p>
<p><a href="http://www.able.co.uk/" target="_blank">www.able.co.uk</a></p>
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		<title>Cell Phone Signal Gets First One-Box Test System From Aeroflex</title>
		<link>http://feedproxy.google.com/~r/TestAndMeasurementTips/~3/1IqSLx_LVj8/</link>
		<comments>http://www.testandmeasurementtips.com/test-equipment/cell-phone-signal-gets-first-one-box-test-system-from-aeroflex/#comments</comments>
		<pubDate>Tue, 09 Feb 2010 21:04:34 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Meters & Testers]]></category>
		<category><![CDATA[Test Equipment]]></category>
		<category><![CDATA[aeroflex]]></category>
		<category><![CDATA[box test]]></category>
		<category><![CDATA[mobile handsets]]></category>

		<guid isPermaLink="false">http://www.testandmeasurementtips.com/?p=1472</guid>
		<description><![CDATA[To speed up real-world testing of mobile handsets for LTE networks ahead of network deployment, Aeroflex is introducing the first one-box test system for cell phone signal fading simulation.
Integrated within the 7100 Series digital radio test set, the new fading simulator option offers RF engineers an inexpensive and reliable baseband tool for signal fading profiling, [...]]]></description>
			<content:encoded><![CDATA[<p><span><img class="alignleft size-full wp-image-1473" title="cell phone signal fader" src="http://www.testandmeasurementtips.com/wp-content/uploads/2010/02/cell-phone-signal-fader.jpg" alt="New LTE signal fading simulator speeds tests of mobile handsets" width="250" height="205" />To speed up real-world testing of mobile handsets for LTE networks ahead of network deployment, Aeroflex is introducing the first one-box test system for cell phone signal fading simulation.</p>
<p>Integrated within the 7100 Series digital radio test set, the new fading simulator option offers RF engineers an inexpensive and reliable baseband tool for signal fading profiling, a requirement for LTE (Long Term Evolution) certification, says the company.</p>
<p>&#8220;Until now, testing and simulating LTE fading profiles meant buying and cabling together two separate test instruments,&#8221; said Phil Medd, product manager, Aeroflex Test Solutions. &#8220;By integrating the LTE fading simulator into the 7100 Series, Aeroflex will save customers tens of thousands of dollars in purchasing additional test equipment and circumvent potential calibration errors that cause faulty test results. In addition, confidence is boosted by the repeatability of the fading profiles.&#8221;</p>
<p>Fading simulators, combined with noise generators, modify RF signals transmitted by the LTE system simulator (in this case the 7100 Series) and emulate degradations introduced into the radio channel by real-life obstacles such as buildings and foliage. For LTE developers who must profile signal fading on mobile handsets to meet 3GPP requirements before a network is available, the 7100 Series fading simulator allows engineers to perform realistic signal fading simulations in a reliable and repeatable lab environment.</p>
<p>As the world&#8217;s cellular network operators work towards adopting LTE, the demand is growing to meet all of the LTE requirements, including fading profiles specified by 3GPP in 36-521-1. The Aeroflex 7100 Series test platform provides fading simulation that meets or exceeds all 3GPP requirements, as well as an unprecedented degree of flexibility in allocating cells and fading taps for LTE user equipment (UE) without the need for manual reconfiguration. The fully repeatable test scenarios presented by the 7100 Series with the fading simulator include the emulation of dynamic environments and realistic and accurate testing of MIMO (multiple-input/multiple output) scenarios.</p>
<p>RF engineers, system integrators, and regression test engineers need to be ready to test new frequency allocations for LTE features at any time. With the LTE future in mind, the 7100 Series fading simulator supports all LTE bandwidths to 20 MHz with a frequency range up to 6 GHz. The Aeroflex fading simulator supports all 3GPP fading profiles, allowing users to determine if their device conforms to 3GPP test specifications.</p>
<p>Based on Aeroflex&#8217;s tried and tested RF and baseband technology, the 7100 Series digital radio test set is &#8216;unique&#8217; in its support of both RF parametric and protocol testing for LTE terminal devices. The 7100 Series simulates a network from the physical layer to the core network IP infrastructure. Focused on the R&amp;D market, from components to handsets, the Aeroflex 7100 Series is a comprehensive test system for LTE mobile devices incorporated into a small footprint, single bench-top instrument, says the company. </span></p>
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		<title>Automated 3-Phase CDN for EFT and Surge Testing</title>
		<link>http://feedproxy.google.com/~r/TestAndMeasurementTips/~3/M74AFxKaeLI/</link>
		<comments>http://www.testandmeasurementtips.com/test-equipment/automated-3-phase-cdn-for-eft-and-surge-testing/#comments</comments>
		<pubDate>Thu, 04 Feb 2010 21:37:33 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Meters & Testers]]></category>
		<category><![CDATA[Test Equipment]]></category>
		<category><![CDATA[cdn]]></category>
		<category><![CDATA[surge testing]]></category>
		<category><![CDATA[teseq]]></category>

		<guid isPermaLink="false">http://www.testandmeasurementtips.com/?p=1468</guid>
		<description><![CDATA[Teseq Inc. released an automated 3-phase coupling/decoupling network (CDN) for EFT and surge testing.  The new CDN 3063 provides safe, reliable operation in a wide range of test setups, including higher current level and 3-phase EUT (equipment under test) testing.
To prevent damage to internal components, the CDN 3063 comes with over temperature protection that allows [...]]]></description>
			<content:encoded><![CDATA[<p><img class="alignleft size-full wp-image-1469" title="CDN 3063" src="http://www.testandmeasurementtips.com/wp-content/uploads/2010/02/CDN-3063.jpg" alt="" width="200" height="146" />Teseq Inc. released an automated 3-phase coupling/decoupling network (CDN) for EFT and surge testing.  The new CDN 3063 provides safe, reliable operation in a wide range of test setups, including higher current level and 3-phase EUT (equipment under test) testing.</p>
<p>To prevent damage to internal components, the CDN 3063 comes with over temperature protection that allows short term operation at current exceeding the nominal rating. A phase rotation indicator in the 3-phase models shows a correctly sequenced power connection for safe EUT operation.</p>
<p>The new system meets IEC requirements for EUT currents over 16 A and ANSI specifications for special coupling modes and pulse amplitude control making it fully compliant with both industry standards.</p>
<p>Available in a burst only configuration (CDN 3063-B32), with surge function only (CDN 3063-S32) or in a combined model that provides both (CDN 3063-C32), the modular CDN 3063 is easily upgraded to protect a user&#8217;s initial investment and quickly adapts to changing test environments.</p>
<p>The CDN 3063 couples burst and surge pulses in 1-, 2- or 3-phase power mains up to 480 V with a current range up to 32 A that incorporates the new IEC standard&#8217;s provision for testing EUT&#8217;s with high power consumption. The standard defines three classes of filter inductance for current ranges: up to 25 A, 25 A to 60 A and 60 A to 100 A. Reduced decoupling inductances in series with the EUT power connection are used in order to minimize series voltage losses with higher current EUTs.</p>
<p>The CDN can couple EFT pulses specified in IEC 61000-4-4 Ed2, the combination wave pulse defined in IEC 61000-4-5 and the ring wave pulse from IEC 61000-4-12 as well as the special amplitude control pulse from ANSI C62.45.</p>
<p>The CDN 3063 utilizes the latest electronic component technology to measure and track the mains voltage and simultaneously control the pulse phase angle and amplitude. When combined with Teseq&#8217;s <a onclick="var s=s_gi(s_account);s.linkTrackVars='prop5,eVar3,prop15';s.prop5='External Link';s.eVar3=s.prop5;s.prop15='83475812';s.tl(this,'o','ExternalLink');" href="http://www.teseq.com/com/en/products_solutions/emc_conducted_esd/surge_generators/NSG_3060_e.pdf" target="_blank">NSG 3060</a> burst generator, the CDN 3063 fulfills the unique coupling requirements designated by ANSI C62.41, which requires a constant peak voltage amplitude for any EUT mains voltage and phase angle.</p>
<p>The CDN 3063 can also be used with Teseq&#8217;s <a onclick="var s=s_gi(s_account);s.linkTrackVars='prop5,eVar3,prop15';s.prop5='External Link';s.eVar3=s.prop5;s.prop15='83475812';s.tl(this,'o','ExternalLink');" href="http://www.teseq.com/com/en/products_solutions/emc_conducted_esd/burst_generators/NSG_3040_e.pdf" target="_blank">NSG 3040</a> burst generators to increase the generator&#8217;s effectiveness and enable its use in higher current level or 3-phase EUT applications.</p>
<p>AC/DC EUT current range is 3 x 32 A continuous, 3 x 40 A for approximately 35 minutes and 3 x 50 A for approximately 10 minutes. The CDN 3063 weighs 43 kg (94.8 lbs) and is 449 mm (17.7&#8243;) wide, 310.5 mm (12.25&#8243;) high and 565 mm (22.2&#8243;) in depth.</p>
<p><a href="http://www.teseq.com/com/en/index.php" target="_blank">www.teseq.com</a></p>
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		<title>Inrared Meter Can Be Pulsed At 180Hz With 50% Modulation Depth</title>
		<link>http://feedproxy.google.com/~r/TestAndMeasurementTips/~3/aAG_wPK0j9o/</link>
		<comments>http://www.testandmeasurementtips.com/sensing/inrared-meter-can-be-pulsed-at-180hz-with-50-modulation-depth/#comments</comments>
		<pubDate>Wed, 27 Jan 2010 23:20:16 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Sensing]]></category>
		<category><![CDATA[cal sensors]]></category>
		<category><![CDATA[infrared applications]]></category>
		<category><![CDATA[modulation depth]]></category>

		<guid isPermaLink="false">http://www.testandmeasurementtips.com/?p=1466</guid>
		<description><![CDATA[Cal Sensors announces the launch of PIREPlus, a high-output, high-pulse rate emitter that can be pulsed as a source of blackbody radiation for near-to-far infrared applications at 180Hz with 50% modulation depth. With a pulsing speed 18 times faster than alternative technologies, the PIREPlus maximizes signal to noise performance, expanding the measurement dynamic range and [...]]]></description>
			<content:encoded><![CDATA[<p><img class="alignright size-full wp-image-1465" title="PirePlus2" src="http://www.testandmeasurementtips.com/wp-content/uploads/2010/01/PirePlus2.jpg" alt="the PIREPlus maximizes signal to noise performance, expanding the measurement dynamic range and resolution for trace gases with very low parts per million." width="200" height="291" />Cal Sensors announces the launch of <em>PIRE<sup>Plus</sup></em>, a high-output, high-pulse rate emitter that can be pulsed as a source of blackbody radiation for near-to-far infrared applications at 180Hz with 50% modulation depth. With a pulsing speed 18 times faster than alternative technologies, the <em>PIRE<sup>Plus</sup></em> maximizes signal to noise performance, expanding the measurement dynamic range and resolution for trace gases with very low parts per million. The solid state emitter offers high output (4&#215;10<sup>-2</sup> watts/cm<sup>2 </sup>at 1 inch from filament) and includes integrated drive electronics.</p>
<p>The <em>PIRE<sup>Plus</sup></em> is suited for a variety of applications, including industrial and medical gas analysis, environmental monitoring, process control instrumentation, spectroscopy and plastics sorting.  The pulsable emitter offers enhanced signal-to-noise ratio, is compatible with a wide range of detector technologies, and comes in an industry-standard T0-5 header package.</p>
<p>The radiating element in <em>PIRE<sup>Plus </sup></em>is an ultra-thin specially designed metallic foil configured to ensure radiation from both sides of the heated foil is efficiently directed out of the package along the optic axis. The foil material has an emissivity of 0.88 and closely emulates a blackbody source in spectral distribution. <em>PIRE<sup>Plus </sup></em>emitters are designed to operate at a rated maximum<em><sup> </sup></em>foil temperature of 1000° Kelvin and are offered with a standard integrated reflector to provide near collimated and uniform radiation output. A variety of elliptical reflectors with varying focal lengths are also available for coupling into optical fibers and other applications.</p>
<p>The <em>PIRE<sup>Plus</sup></em> comes with integrated drive electronics in an industry standard 14 pin-dip IC package. The user-friendly drive electronics are voltage variable and allow users to select from a wide range of frequencies between 1Hz and 500Hz according to their specific application needs. A special feature of the drive electronics is the ability to provide peak pulse temperatures independent of the pulse frequency.  This ensures the highest output for any application.</p>
<p>Compatible with a wide range of IR detector technologies, the <em>PIRE<sup>Plus </sup></em>emitter can be paired with Cal Sensor´s new MIRA4 four-color lead selenide (PbSe) sensor that provides industry-leading sensitivity of 1.5E10 Jones in the detection of up to four distinct gases in the 1.0 to 5.5 µm infrared region. The <em>PIRE<sup>Plus </sup></em>emitter and MIRA4<em><sup> </sup></em>detector can be purchased together as an integrated module for quick integration and efficient design and performance.</p>
<p>The <em>PIRE<sup>Plus </sup></em>represents the latest generation of PIRE pulsable emitters that Cal Sensors officially launched at booth 2600 of the SPIE-sponsored Photonics West exhibit held January 26-28 in San Francisco, California. Cal Sensors exhibited a full line of innovative IR detector and emitter technologies at the event.</p>
<p><a href="http://www.calsensors.com/" target="_blank">www.calsensors.com</a></p>
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		<title>Laser Beam Analyzer Runs on Microsoft® Vista or Windows 7</title>
		<link>http://feedproxy.google.com/~r/TestAndMeasurementTips/~3/XWywhTMkPrw/</link>
		<comments>http://www.testandmeasurementtips.com/calibration/laser-beam-analyzer-runs-on-microsoft%c2%ae-vista-or-windows-7/#comments</comments>
		<pubDate>Mon, 25 Jan 2010 21:55:59 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Calibration]]></category>
		<category><![CDATA[Meters & Testers]]></category>
		<category><![CDATA[Sensing]]></category>
		<category><![CDATA[laser beam analysis]]></category>
		<category><![CDATA[Ophir Spiricon]]></category>
		<category><![CDATA[photonicswest]]></category>

		<guid isPermaLink="false">http://www.testandmeasurementtips.com/?p=1460</guid>
		<description><![CDATA[At PhotonicsWest 2010 Ophir Spiricon announced BeamGage Professional, its newest addition to the company&#8217;s laser beam analysis systems.
BeamGage Professional builds on the features included in BeamGage Standard: Beam-Maker beam simulator, automatic camera control for ease of use, and comprehensive set of beam analysis algorithms. The Professional version adds such new capabilities as partitioning of the [...]]]></description>
			<content:encoded><![CDATA[<p>At PhotonicsWest 2010 Ophir Spiricon announced BeamGage Professional, its newest addition to the company&#8217;s laser beam analysis systems.</p>
<p><span style="font-family: Tahoma,Arial,Helvetica,sans-serif; font-size: x-small;"><span><span><span><img class="alignleft size-full wp-image-1461" title="BeamGage Professional" src="http://www.testandmeasurementtips.com/wp-content/uploads/2010/01/BeamGage-Professional.jpg" alt="BeamGage Laser uses a comprehensive set of beam analysis systems" width="250" height="245" /></span></span></span></span>BeamGage Professional builds on the features included in BeamGage Standard: Beam-Maker beam simulator, automatic camera control for ease of use, and comprehensive set of beam analysis algorithms. The Professional version adds such new capabilities as partitioning of the camera output for separate analysis of multiple laser beams from sources such as fiber, a .NET interface for full remote control when integrating beam analysis into an automated application, and camera sharing.</p>
<p>Analysis of individual Beams</p>
<p>BeamGage Professional now supports partitioning of the camera output. This enables analysis of individual beams when multiple beams impinge on the camera simultaneously. This is particularly useful when analyzing multiple fibers in a single bundle. Individual partitions can be viewed in the 2D display window one at a time or all at once. The 3D display shows all at once.</p>
<p>.NETAutomation Interface</p>
<p>Applications can now be automated by interfacing through BeamGage Professional’s .NET controls for embedded or remote operation. Users can control the software using Active X or National Instruments’ LabVIEWcontrols. Features that can be automated include launch and termination of the application, camera settings, data capture, and image capture. Examples are provided in LabVIEW, Excel, Visual Studio.Net C#, and Visual Studio.NET VB.</p>
<p>Accurate Measurements</p>
<p>BeamGage Professional is based on UltraCal™, Ophir-Spiricon’s patented baseline correction algorithm that helped establish the ISO 11146-3 standard for beam measurement accuracy. Beam-Gage provides high accuracy results, guaranteeing the data baseline (zero reference point) is accurate to 1/10th of a digital count on a pixel-by-pixel basis.</p>
<p>BeamGage allows you to configure as many measurements as needed; it includes over 55 separate measurement choices, including many based on ISO standards, such as Centroid X and Y, Ellipticity, Eccentricity, Peak Fluence, and more.</p>
<p>Enhanced Interface</p>
<p>Running on Microsoft® Vista orWindows 7, BeamGage Professional operates in 32-bit mode for faster processing. Enhanced 3D graphics improve data rendering. The software supports a selection of cameras with FireWire (1394) and USB interfaces that cover wavelengths from 190 to 3000nm.</p>
<p><a href="http://www.ophiropt.com/" target="_blank">www.ophiropt.com</a></p>
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		<title>Digital Multimeter Has USB &amp; Cable Adapters</title>
		<link>http://feedproxy.google.com/~r/TestAndMeasurementTips/~3/a4DFo6RNDGU/</link>
		<comments>http://www.testandmeasurementtips.com/meters-testers/bench/digital-multimeter-has-usb-cable-adapters/#comments</comments>
		<pubDate>Mon, 18 Jan 2010 21:17:50 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Bench Test]]></category>
		<category><![CDATA[Meters & Testers]]></category>
		<category><![CDATA[digital multimeter]]></category>
		<category><![CDATA[fluke]]></category>

		<guid isPermaLink="false">http://www.testandmeasurementtips.com/?p=1456</guid>
		<description><![CDATA[Fluke Corporation announced enhancements to its bench digital multimeters. The Fluke 8808A 5.5 digit Digital Multimeter and the 8845A/8846A 6.5 digit Multimeters will now include a USB to RS232 Cable Adapter as well as FlukeView Forms Basic software.
www.fluke.com
]]></description>
			<content:encoded><![CDATA[<p><img class="aligncenter size-full wp-image-1457" title="digitimeter" src="http://www.testandmeasurementtips.com/wp-content/uploads/2010/01/digitimeter.jpg" alt="" width="300" height="212" />Fluke Corporation announced enhancements to its bench digital multimeters. The Fluke 8808A 5.5 digit Digital Multimeter and the 8845A/8846A 6.5 digit Multimeters will now include a USB to RS232 Cable Adapter as well as FlukeView Forms Basic software.</p>
<p><a href="http://us.fluke.com/usen/home/default.htm" target="_blank">www.fluke.com</a></p>
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