258 85 http://www.patentstorm.us/ http://www.patentstorm.us/images/logo.gif http://www.patentstorm.us/rss/class/patents/rss-346.xml Recent patents filings in USPTO Class 346 Recorders. Tue, 7 Feb 2012 16:05:18 patents@patentstorm.us en http://feedproxy.google.com/~r/Patentstorm-Patents-Recorders/~3/Bu3dEknDgz8/description.html <ul><li><strong>Patent Number:</strong> &nbsp;8102408</li><li><strong>Publication Date:</strong> &nbsp;2012-01-24</li><li><strong>Inventors:</strong> &nbsp;Lehon, Harold; Hess, Carl; Verma, Gaurav; Su, Bo; Volk, William</li></ul> <p>Computer-implemented methods and systems for determining different process windows for a wafer printing process for different reticle designs are provided. One method includes generating simulated images illustrating how each of the different reticle designs will be printed on a wafer at different values of one or more parameters of the wafer printing process. The method also includes detecting defects in each of the different reticle designs using the simulated images. In addition, the ...<br /> <p><a href="http://feedads.g.doubleclick.net/~a/EGYlKdD53SBCEEvWH_6deOWqYks/0/da"><img src="http://feedads.g.doubleclick.net/~a/EGYlKdD53SBCEEvWH_6deOWqYks/0/di" border="0" ismap="true"></img></a><br/> <a href="http://feedads.g.doubleclick.net/~a/EGYlKdD53SBCEEvWH_6deOWqYks/1/da"><img src="http://feedads.g.doubleclick.net/~a/EGYlKdD53SBCEEvWH_6deOWqYks/1/di" border="0" ismap="true"></img></a></p><img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-Recorders/~4/Bu3dEknDgz8" height="1" width="1"/> 8102408 http://www.patentstorm.us/patents/8102408/description.html