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		    <title>PatentStorm -&gt; Patents -&gt; Optics: measuring and testing</title>
		    <link>http://www.patentstorm.us/rss/class/patents/rss-356.xml</link>
		    <description>Recent patents filings in USPTO Class 356 Optics: measuring and testing.</description>
		    <pubDate>Tue, 18 Jun 2013 16:09:54</pubDate>
		    <managingEditor>patents@patentstorm.us</managingEditor>
		    <language>en</language><atom10:link xmlns:atom10="http://www.w3.org/2005/Atom" rel="self" type="application/rss+xml" href="http://feeds.feedburner.com/Patentstorm-Patents-OpticsMeasuringAndTesting" /><feedburner:info uri="patentstorm-patents-opticsmeasuringandtesting" /><atom10:link xmlns:atom10="http://www.w3.org/2005/Atom" rel="hub" href="http://pubsubhubbub.appspot.com/" /><item>
			         <title><![CDATA[Lay length and ratio measuring device for electrical cable]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/Up5BQJjLdgk/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467073&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A lay meter includes a computer based device, a light source for creating a light plane operably connected with the computer based device, a shadow based sensor a light plane operably connected with the computer based device, and signal processing circuits and software for processing sensed signals such that a clean square wave voltage signal is generated in direct response to the lays passing through the light ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/Up5BQJjLdgk" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Target apparatus and method of making a measurement with the target apparatus]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/-Xw7XwBKum4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467072&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; ; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A target includes a contact element having a region of spherical curvature, a retroreflector rigidly connected to the contact element, a transmitter configured to emit an electromagnetic signal, a temperature sensor disposed on the target, configured to measure an air temperature, and configured to send the measured air temperature to the ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/-Xw7XwBKum4" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Automatic measurement of dimensional data with a laser tracker]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/xS-VajpVJ_c/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467071&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Measuring with a system having retroreflector targets and a laser tracker includes storing a list of nominal coordinates for three targets and at least one added point; capturing on a photosensitive array of the tracker a portion of the light emitted by a light beam and reflected off the three targets; obtaining spot positions on a photosensitive array of a tracker camera from light reflected off the three targets; determining a correspondence between three spot positions on the tracker ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/xS-VajpVJ_c" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8467071/description.html</feedburner:origLink></item>
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			         <title><![CDATA[Method and scanning arrangement for the contactless scanning of three-dimensional objects and device for holding the objects]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/4rDqfc5le0c/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467070&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The invention concerns a method for the contactless scanning of three-dimensional objects (&lt;b&gt;1&lt;/b&gt;). The objects are scanned using a bundled light beam (&lt;b&gt;7&lt;/b&gt;), preferably using a laser beam. The object is scanned in at least two different measuring sections. When scanning in two different measuring sections, the measuring lines on the object (&lt;b&gt;1&lt;/b&gt;) are not parallel. As an alternative or additional option, the object (&lt;b&gt;1&lt;/b&gt;) is rotated during one measuring operation and not ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/4rDqfc5le0c" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8467070/description.html</feedburner:origLink></item>
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			         <title><![CDATA[Method and device for inspecting the quality of a formed thermoplastic fiber-reinforced plastic component]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/DCIeGMtZFPo/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467069&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method and a device for inspecting the quality of a formed thermoplastic fiber-reinforced plastic component wherein the component is tested by means of a sensor unit with a downstream electronic evaluation unit for analysis of the measuring result acquired by sensor technology by means of sample comparison, wherein by means of the optical sensor unit the surface roughness of the plastic component is measured after forming, which surface roughness is analyzed by means of the evaluation ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/DCIeGMtZFPo" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Laser gyro comprising a cylindrical solid amplifier bar, and associated method for exciting a cylindrical solid amplifier bar of a laser gyro]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/2wFNsNrkhD4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467068&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A laser gyro includes a cylindrical solid amplifier bar having an axis of revolution. The laser gyro also includes: an annular piezoelectric element for exciting said solid amplifier element at a predetermined frequency f, along said axis of revolution, said annular piezoelectric element being mounted fixed on one of the two end cross sections of the cylindrical solid amplifier bar so that its axis of revolution coincides with said axis of revolution of said cylindrical solid amplifier bar; ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/2wFNsNrkhD4" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Dynamic light-scattering measuring apparatus using low-coherence light source and light-scattering measuring method of using the apparatus]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/h7T29EbhZHI/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467067&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;There is provided a dynamic light-scattering measuring apparatus including: a Mach-Zehnder interferometer; and a low-coherence light source. Further, there is provided a method for measuring light-scattering intensity of particles in a medium, including the steps of: providing a Mach-Zehnder interferometer; and measuring light-scattering intensity from light emitted from a low-coherence light source, in accordance with a dynamic light-scattering intensity measuring ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/h7T29EbhZHI" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Mixture segregation testing devices and methods]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/V9qNkP2XfP4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467066&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Methods and devices are provided to measure segregation in solid particulate mixtures. Light energy is projected through a transparent barrier and reflected off a surface of a mixture volume. The constituent fraction in the mixture is determined by analyzing the mixture reflected light as a combination of the constituents' known reflected light spectral contents and intensities. This is accomplished at multiple surface locations to provide constituent fraction data over the mixture volume ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/V9qNkP2XfP4" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Reflective optical sensor and image forming apparatus]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/o1zlhEzfVvc/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467065&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A reflective optical sensor detects a position and/or a toner density of the toner pattern. The reflective optical sensor includes an illuminating system that has at least three light-emitting units, a light-receiving system that has at least three light-receiving units and receives light output from the illuminating system and reflected by the toner pattern, and an illuminating optical system that includes at least three illuminating condenser lenses individually corresponding to the at ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/o1zlhEzfVvc" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Gas sampling device]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/709csG6arrs/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467064&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The invention relates to a gas sampling device comprising a probe for sampling gas, an exploiting device for exploiting the gases sampled, a pipe for transmitting the gases sampled by the probe to the exploiting device, and means for lowering the pressure of the gases sampled in the pipe, to lower the dew point of the gases sampled, the means for lowering the pressure comprising an expansion nozzle arranged in the probe and communicating with the pipe, and a suction device for sucking the ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/709csG6arrs" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Method and apparatus for determining a focal position of an imaging device adapted to image a biologic sample]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/1uTSA9vlf5g/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467063&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method and apparatus for focusing a device for imaging a biologic sample is provided. A method aspect includes the steps of: disposing lenslets within a biologic sample, which lenslets have a height and a refractive index, which refractive index is different from that of the sample, wherein one or both of the imaging device and the sample are relatively locatable so a focal position of the imaging device can be moved along the height of the lenslets; imaging a portion of the sample ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/1uTSA9vlf5g" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Inspection device and producing method of wired circuit board]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/7ie1ScII4BI/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467062&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An inspection device includes a light emitting unit emitting incident light that enters the insulating cover layer and a light receiving unit receiving reflected light that is reflected from the incident light on the surface of the insulating cover layer. The light emitting unit includes a first light emitting portion in a ring state that emits the incident light so that the angle thereof with respect to the surface of the insulating base layer is in the range of 25° or less and a second ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/7ie1ScII4BI" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Integrated analytical system and method]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/4PwQaH_ud70/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467061&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An analytical assembly within a unified device structure for integration into an analytical system. The analytical assembly is scalable and includes a plurality of analytical devices, each of which includes a reaction cell, an optical sensor, and at least one optical element positioned in optical communication with both the reaction cell and the sensor and which delivers optical signals from the cell to the sensor. Additional elements are optionally integrated into the analytical assembly. ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/4PwQaH_ud70" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Colour image reference system for monitor and projector images]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/SqzJTPZ6KqQ/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467060&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A test apparatus comprising a self illuminated light source and second moveable element having spectrophotometrically neutral gray and color patches of predetermined hues and saturations. A digital software file provides identical spectrophotometrically neutral grayscale and color data which, when reproduced on a monitor or projection system, should match the grayscale and test colors provided by the apparatus. When the apparatus is placed in front of the monitor image or projected image, ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/SqzJTPZ6KqQ" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Deep-UV LED and laser induced fluorescence detection and monitoring of trace organics in potable liquids]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/3VwUgjhHnRc/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467059&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An apparatus for measuring fluorescence of potable liquids contained within an optical quartz cell includes a deep UV laser or a compact UV LED that generates a light beam. A UV blocking and visible light transmitting optical filter reduces out-of-band emission from the LED. The optical quartz cell is between a pair of plane mirrors so that light from the light source travels through it several times. A concave mirror collects a fluorescence signal and has a common optical axis with a lens. ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/3VwUgjhHnRc" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Light source assembly and related lens testing device]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/VeQrctY2F1c/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467058&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A lens testing device includes a light source assembly, a pattern plate, and an imaging sensor. The light source assembly includes a transparent base plate, a light guide plate, and a number of illuminants. The light source assembly uses the light guide plate to uniformize a light come from the illuminants and emit the light onto the pattern plate. The imaging sensor is placed beneath the transparent base plate to sense the light passing through the pattern plate and focused by a ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/VeQrctY2F1c" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Ellipsometers and polarimeters comprising polarization state compensating beam directing sample wobble compensating system, and method of use]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/jVan4gc4cqw/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467057&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An improved system and method for investigation of a wobbling surface of a sample with an electromagnetic beam, involving application of a beam directing dual reflection surface “prism” system, which, while effecting beam locus direction rotation of 90 degrees also preserves beam polarization state. The system allows causing an electromagnetic beam to access an otherwise difficult to access sample in, for instance, a vacuum deposition chamber, and enables achieving very closely spaced ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/jVan4gc4cqw" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Variable angle, fiber optic coupled, light scattering apparatus]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/gkD0wVmj3LI/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467056&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A light scattering apparatus and methods for using a light scattering apparatus that performs at angles other than the standard 90 or 180 degrees and can analyze a variety of samples including, but not limited to, solids, crystals, liquids, gases and combinations ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/gkD0wVmj3LI" height="1" width="1"/&gt;</description>
			         
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<item>
			         <title><![CDATA[Optical measuring device]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/3FZ1bIiiJIs/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467055&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An optical measuring device includes: a light applying section configured to apply laser light to a sample flowing in a channel; and a fluorescence detecting section configured to detect fluorescence generated from the sample irradiated with the laser light; the fluorescence detecting section including a multichannel photomultiplier tube having a plurality of detection channels capable of simultaneously detecting a plurality of light beams, a light separator configured to separate the ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/3FZ1bIiiJIs" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Virtual core flow cytometry]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/oPZJ2BgOsA4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467054&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A sheathless flow cytometry system is disclosed wherein a fluid containing particles of interest, for example cells, flows through a sensing region, and is illuminated in the sensing region with one or more light source. Light resulting from the interaction of the particles with the illumination is received by an objective, and focused toward a field stop having an aperture comprising relatively large end portions and a relatively small center portion. Light deflectors, such as prisms, are ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/oPZJ2BgOsA4" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Identification of body fluids using raman spectroscopy]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/Hd-nifJ_4Dk/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467053&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The present invention relates to a method of identifying types of body fluids in a sample. This method involves providing a sample potentially containing one or more types of body fluids. The sample is subjected to Raman spectroscopy to produce a Raman spectroscopic signature for the sample. The Raman spectroscopy signature is identified to ascertain the types of body fluids in the sample. A method of establishing a reference Raman spectroscopic signature for specific types of body fluids ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/Hd-nifJ_4Dk" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Systems and methods for detecting contaminants in a sample]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/A7VP2WX5AUw/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467052&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; ; ; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;System and method for determining the presence of a contaminant in a sample using Raman spectroscopic data. The sample may be food or feed and the contaminant may be melamine. The sample is illuminated with substantially monochromatic light to produce Raman scattered photons. The Raman scattered photons are collected to generate Raman spectroscopic data. The Raman spectroscopic data may comprise at least one of a Raman spectrum and a spatially accurate wavelength resolved Raman image. The ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/A7VP2WX5AUw" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Widely-tunable semiconductor source integrated in windowed hermetic package]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/nT7yvj5EAuM/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467051&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A near infrared (NIR) semiconductor laser system is shown for gas sensing. An embodiment is centered on the use of a system with a much wider tunable laser, which today has a scan band of more than 150 nanometers (nm) to as much as 250 nm or more. In some cases the scan band is about 400 nm or more. This is achieved in the current embodiment through the use of a widely tunable microelectromechanical system (MEMS) based Fabry-Perot filter as an integral part of the laser cavity. Using this ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/nT7yvj5EAuM" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Apparatus and method for metering flare gas]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/WQkQ31eV74s/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467050&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A flow cell assembly for measuring the flow rate of gas in a pipe having an optical probe mounted on a flow cell inserted between sections of pipe. A distal end of the optical probe is disposed within an internal bore of the flow cell. The optical probe is capable of measuring the velocity of particles in a gas flowing through the internal bore. A sensor mechanism may be mounted on the flow cell and have a sensor array with a distal end disposed within the flow cell internal bore. The ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/WQkQ31eV74s" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8467050/description.html</feedburner:origLink></item>
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			         <title><![CDATA[Manhole modeler using a plurality of scanners to monitor the conduit walls and exterior]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/i_jwPTDeTUc/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467049&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Methods and apparatuses for inspecting manholes or other voids and collecting data in a comprehensive, repeatable, and measurable manner. A sensor head is suspended and lowered into a manhole or other void. The sensor head collects data related to the condition of the manhole or void walls, and locations of defects, damage, or lateral pipe openings. The data can then be processed to provide a three-dimensional model of the manhole or void, and can be compared to previous or future ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/i_jwPTDeTUc" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8467049/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Pattern defect inspection apparatus and method]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/afwRayKwbjA/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467048&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A pattern defect inspection apparatus capable of detecting minute defects on a sample with high sensitivity without generating speckle noise in signals is realized. Substantially the same region on a surface of a wafer is detected by using two detectors at mutually different timings. Output signals from the two detectors are summed and averaged to eliminate noise. Since a large number of rays of illumination light are not simultaneously irradiated to the same region on the wafer, a pattern ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/afwRayKwbjA" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Systems and methods for detecting defects on a wafer]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/L8_0-vBeLtw/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467047&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; ; ; ; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Systems and methods for detecting defects on a wafer are provided. One method includes generating output for a wafer by scanning the wafer with an inspection system using first and second optical states of the inspection system. The first and second optical states are defined by different values for at least one optical parameter of the inspection system. The method also includes generating first image data for the wafer using the output generated using the first optical state and second ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/L8_0-vBeLtw" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Goniophotometer]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/dw8mOjsqS58/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467046&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A goniophotometer has a main rotating table, a sync-rotating table, a luminaire rotating table and light detecting tubes (&lt;b&gt;4&lt;/b&gt;-&lt;b&gt;1, 4&lt;/b&gt;-&lt;b&gt;2&lt;/b&gt;). The main rotating table has a main rotating axis (&lt;b&gt;1&lt;/b&gt;-&lt;b&gt;2&lt;/b&gt;) and a main mirror (&lt;b&gt;1&lt;/b&gt;-&lt;b&gt;4&lt;/b&gt;) reflecting the light from a luminaire under test (&lt;b&gt;5&lt;/b&gt;). The sync-rotating table has a sync-rotating axis (&lt;b&gt;2&lt;/b&gt;-&lt;b&gt;2&lt;/b&gt;) and a sync-mirror (&lt;b&gt;2&lt;/b&gt;-&lt;b&gt;4&lt;/b&gt;) located in the reflection path of the main mirror ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/dw8mOjsqS58" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Method of determining the contact angle of a ball bearing]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/i2zULpLNLIM/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467045&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;To determine the contact angle of a ball bearing, one of two rings is rotated while the other ring is held stationary. The number of revolutions of the rotated ring and the number of revolutions accomplished in the same period by the balls, and therefore by the retaining cage, are detected. The revolutions of the balls are detected through an optical detecting device which projects a radiation through the bearing, in the gap between the outer and inner rings, whereby the radiation is ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/i2zULpLNLIM" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Continuous index of refraction compensation method for measurements in a medium]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/fZ-jCAosVJk/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467044&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Described herein are devices and methods for making extremely accurate measurements in a medium by continuously measuring the index of refraction of the medium such as water or biological tissue. Also described herein is a device for constantly measuring the index of refraction, and using the index of refraction data to constantly calibrate the optical measurement device. In addition, a primary measurement device (a ladar) that is optimized for data collection in a volume backscattering ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/fZ-jCAosVJk" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Lens module testing apparatus]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/ucSU4XvXqwU/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467043&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An apparatus for testing a lens module includes a light source, a recording element, and an analyzing device. The lens module includes an actuator and a barrel. The light source emits a light beam towards the barrel. The light beam is reflected by the barrel and forms a light spot on the recording element. The recording element records a position of the light spot. The analyzing device calculates a distance between the position of the light spot and a reference position, compares the ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/ucSU4XvXqwU" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Lens shape measuring apparatus and the method thereof, manufacturing method of spectacle lens, and manufacturing method of spectacles]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/mjIM4MLOnfY/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467042&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A lens shape measuring apparatus measures a peripheral shape of a lens in order to measure the peripheral shape of the lens accurately according to a non-contact technique. The lens shape measuring apparatus includes: a lens holding mechanism section for holding the lens with the holding axis from the side of a lens surface; and a laser displacement meter for measuring a lens peripheral shape by irradiating a laser beam to the periphery of the lens and receiving a reflected light thereof. ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/mjIM4MLOnfY" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Fiber optic port signature applicator]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/MpVWPMHhaBs/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467041&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An apparatus for illuminating optical fibers, said apparatus includes a housing having a face; fiber ports disposed on said face, each of said fiber ports being configured to engage a connector on an optical fiber; port lamps, each being disposed to provide light through a corresponding one of said fiber ports; and a control system configured to cause said port lamps to provide light according to corresponding port signatures, said port signatures being distinct from each ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/MpVWPMHhaBs" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Method and apparatus for sorting cells]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/mCn-0qTX43w/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467040&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method, apparatus, and system for a sorting flow cytometer include an objective lens having an optical axis coaxially aligned with the flow path at the focal point. A controllable energy source selectively alters an analyte according to a determination of whether the analyte is in a desired sub-population. In various embodiments, one or both of the emission from the controllable energy source and/or the emission from an illumination energy source passes through the objective lens. In some ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/mCn-0qTX43w" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Device and method for the detection of particles]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/aPO_C1t7HOI/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467039&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The present invention relates to devices and methods for the qualitative and/or quantitative detection of particles. In particular, the invention relates to devices for the detection of particles, comprising a reaction chamber formed within a chamber body between a first surface and a second surface, wherein the second surface is located opposite to the first surface, and one or more displacers, wherein the distance between the first surface and the second surface is variable via the one or ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/aPO_C1t7HOI" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Method and device for measuring optical properties of an optically variable marking applied to an object]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/D2mlqlyr4m0/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467038&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method for measuring optical properties of an optically variable marking applied on an object, the method including the steps of illuminating the optically variable marking so as to form a first light reflected by the marking at a first view angle and a second light reflected by the marking at a second view angle, the first and second lights having different spectral compositions as a result of the optically variable marking, refracting the second reflected light through a optical unit so ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/D2mlqlyr4m0" height="1" width="1"/&gt;</description>
			         
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<item>
			         <title><![CDATA[Method and device for optimizing the orientation of a laser anemometer on an aircraft]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/iEYMdojYBi4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467037&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method and device for optimizing the orientation of a laser anemometer on an aircraft. The device can determine an optimal orientation of a sighting axis of the anemometer and deduce therefrom the orientations of the other sighting ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/iEYMdojYBi4" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8467037/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Laser instrument for electro-optical distance measurement]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/ShvjtvX2DkU/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8467036&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A laser instrument for electro-optical measurement of the distance of a target object to a reference mark is disclosed. The instrument includes a housing, a measuring device which emits a laser beam and determines a distance value from the receiving beam coming from the target object, an outlet opening to couple out the laser beam from the housing, a display device to display the distance value and an operating device to operate the laser instrument and to start a distance measurement. The ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/ShvjtvX2DkU" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8467036/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Immersion objective lens, retention mechanism for immersion medium, and manufacturing method thereof]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/3GLFCyd_SHY/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8465709&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;There is provided a retention mechanism for an immersion medium, for use in a device which observes/measures a sample by use of an immersion objective lens, includes a member which retains the immersion medium near a tip portion of the objective lens, wherein the member is configured to include at least first and second ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/3GLFCyd_SHY" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8465709/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Immersion objective lens, retention mechanism for immersion medium, and manufacturing method]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/TJYxQnHay4Q/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8465708&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-18&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;There is provided a retention mechanism for an immersion medium, for use in a device which observes/measures a sample by use of an immersion objective lens, includes a member which retains the immersion medium near a tip portion of the objective lens, wherein the member is configured to include at least first and second ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/TJYxQnHay4Q" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8465708/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Position measuring device]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/ROHROlaz3TQ/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8462359&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-11&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A position measuring device includes a plurality of concave marks, a light source portion, a light receiving portion, and a concave portion measuring portion. The concave marks are formed on an external wall of an object to be a measuring target. Each of the plurality of the concave marks includes a plurality of concave portions disposed on a concentric circle with a preset concave mark central position to be a center of the concentric circle. The concave portions are provided so that ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/ROHROlaz3TQ" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8462359/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Device for detecting movement and forces]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/B_paoGMaTg8/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8462358&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-11&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The invention relates to an apparatus for input of movements and/or registration of forces, comprising at least one light source, at least one position sensitive device (PSD) and at least one diaphragm, wherein at least one of these three elements is moveable with respect to the two other elements. The light source is arranged at a mounting so that light from the light source is emitted through an opening in the mounting and through the at least one diaphragm onto the at least one ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/B_paoGMaTg8" height="1" width="1"/&gt;</description>
			         
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<item>
			         <title><![CDATA[Device and method for obtaining three-dimensional object surface data]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/yGTd3Nr61Gg/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8462357&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-11&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The concept includes projecting at the object surface, along a first optical axis, two or more two-dimensional (2D) images containing together one or more distinct wavelength bands. The wavelength bands vary in intensity along a first image axis, forming a pattern, within at least one of the projected images. Each projected image generates a reflected image along a second optical axis. The 3D surface data is obtained by comparing the object data with calibration data, which calibration data ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/yGTd3Nr61Gg" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Apparatus and method for observing the surface of a sample]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/BwSjE3H4Oz4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8462356&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-11&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An apparatus for observing the optical appearance of a surface (&lt;b&gt;2&lt;/b&gt;) of a sample (&lt;b&gt;1&lt;/b&gt;) of semitransparent material, in particular the surface (&lt;b&gt;2&lt;/b&gt;) of a human skin, the apparatus comprising a light source (&lt;b&gt;11,12,13,16,17&lt;/b&gt;) for illuminating at least a region of interest of the surface (&lt;b&gt;2&lt;/b&gt;) of the sample (&lt;b&gt;1&lt;/b&gt;) from a predetermined direction, a camera (&lt;b&gt;14&lt;/b&gt;) for observing a response to the illumination of the region of interest and an optical focus device ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/BwSjE3H4Oz4" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8462356/description.html</feedburner:origLink></item>
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			         <title><![CDATA[3D scanning acousto-optic microscope]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/AKfMEzyDhz4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8462355&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-11&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A scanning microscope includes an acousto-optic scanner that produces a scanned beam. A beam separator based on total internal reflection or angle tuning of a dielectric filter separates an unscanned portion of an excitation light flux from a scanned portion. The scanned beam is directed to a specimen, and optical radiation generated in response to the scanned beam is directed to a detector that produces a detected signal that can be used to determine an image. The scanned beam can be ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/AKfMEzyDhz4" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8462355/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Aircraft icing detector]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/Tb76RH7yXts/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8462354&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-11&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method for aircraft surface contamination detection and measurement includes: mounting a laser probe on an airfoil; positioning the laser probe to emit laser energy at multiple pre-determined surface points along the leading edge of the airfoil; and using a processor device for activating the laser probe and obtaining measurement data for generating a surface contour of the shape and accurate measurement of the depth of airfoil icing in the surface target area. The icing data is presented ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/Tb76RH7yXts" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Surface shape measurement apparatus]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/aKBHtzoi2t0/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8462353&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-11&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An apparatus for measuring a shape of a surface, comprises a measurement head which measures a direction of a normal from the surface to a reference point by detecting test light obtained when light that passes through the reference point is emitted, is reflected by the surface, and returns to the reference point, a scanning mechanism which scans the measurement head, and a processor which calculates the shape of the surface based on the direction of the normal measured using the ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/aKBHtzoi2t0" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Surface inspection tool and surface inspection method]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/vm0GDqrptIQ/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8462352&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-11&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A surface inspection tool &lt;b&gt;110&lt;/b&gt; measures scattering light intensity of scattering light generated by irradiated irradiation light in association with a measurement coordinate on a wafer &lt;b&gt;200&lt;/b&gt; with patterns and inspects the surface roughness of the wafer &lt;b&gt;200&lt;/b&gt;. The surface inspection tool includes a controller &lt;b&gt;250&lt;/b&gt; which extracts measurement coordinate of the measured scattering light intensity that is equal to or more than a lower limit threshold L, sets an inspection ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/vm0GDqrptIQ" height="1" width="1"/&gt;</description>
			         
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<item>
			         <title><![CDATA[Measurement method and measurement apparatus]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/Cd1ah2bvxT8/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8462351&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-11&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The present invention provides a measurement apparatus including a reflector configured to reflect a light traveling from an optical system, a detector configured to detect a light incident thereon via the reflector and a measurement optical system including one of a reference surface and a wavefront conversion element, and a load application device configured to apply a load to the reflector in an application direction perpendicular to the optical axis, the load application device applying ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/Cd1ah2bvxT8" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Optically enhanced holographic interferometric testing methods for the development and evaluation of semiconductor devices, materials, wafers, and for monitoring all phases of development and manufacture]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~3/koLckKmUqck/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8462350&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-06-11&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Improved methods and systems for inspection imaging for holographic or interferometric semiconductor test and evaluation through all phases of device development and manufacture. Specifically, systems and methods are disclosed for extending the range of optical holographic interferometric inspection for testing and evaluating microelectronic devices and determining the interplay of electromagnetic signals and dynamic stresses to the semiconductor material are provided in which an enhanced ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-OpticsMeasuringAndTesting/~4/koLckKmUqck" height="1" width="1"/&gt;</description>
			         
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