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		    <title>PatentStorm -&gt; Patents -&gt; Electricity: measuring and testing</title>
		    <link>http://www.patentstorm.us/rss/class/patents/rss-324.xml</link>
		    <description>Recent patents filings in USPTO Class 324 Electricity: measuring and testing.</description>
		    <pubDate>Tue, 7 Feb 2012 16:03:06</pubDate>
		    <managingEditor>patents@patentstorm.us</managingEditor>
		    <language>en</language><atom10:link xmlns:atom10="http://www.w3.org/2005/Atom" rel="self" type="application/rss+xml" href="http://feeds.feedburner.com/Patentstorm-Patents-ElectricityMeasuringAndTesting" /><feedburner:info uri="patentstorm-patents-electricitymeasuringandtesting" /><atom10:link xmlns:atom10="http://www.w3.org/2005/Atom" rel="hub" href="http://pubsubhubbub.appspot.com/" /><item>
			         <title><![CDATA[Method for evaluating silicon wafer]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/YTfDA3lWeXo/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111081&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Saito, Hisayuki&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The present invention is a method for evaluating a silicon wafer by measuring, after fabricating a MOS capacitor by forming an insulator film and one or more electrodes sequentially on a silicon wafer, a dielectric breakdown characteristic of the insulator film by applying an electric field from the electrodes thus formed to the insulator film, the method in which the silicon wafer is evaluated at least by setting an area occupied by all the electrodes thus formed to 5% or more of an area ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/DaC5-OAwj9M_ctR_CAQ-319_pe0/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/DaC5-OAwj9M_ctR_CAQ-319_pe0/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/DaC5-OAwj9M_ctR_CAQ-319_pe0/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/DaC5-OAwj9M_ctR_CAQ-319_pe0/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/YTfDA3lWeXo" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8111081/description.html</feedburner:origLink></item>
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			         <title><![CDATA[Conductivity measuring apparatus and conductivity measuring method]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/kzpeFInwiHo/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111079&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Fukuchi, Takakazu; Yasutake, Masatoshi&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A conductivity measuring apparatus includes a probe base having a pair of electrodes disposed on respective opposite surfaces of a portion of the probe base. Observing and grasping probes are supported by the probe base in a cantilever state and are arranged adjancent to and spaced apart from one another by a predetermined distance. The grasping probe has a pair of electrodes disposed on respective opposite surfaces of a portion of the grasping probe confronting the portion of the probe ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/qFS_7PLDKRI2U_gN9Jux33OaTqs/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/qFS_7PLDKRI2U_gN9Jux33OaTqs/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/qFS_7PLDKRI2U_gN9Jux33OaTqs/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/qFS_7PLDKRI2U_gN9Jux33OaTqs/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/kzpeFInwiHo" height="1" width="1"/&gt;</description>
			         
			         <guid isPermaLink="false">8111079</guid>
			
			      <feedburner:origLink>http://www.patentstorm.us/patents/8111079/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Oxidizing power sensor for corrosion monitoring]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/RKARqLCsB20/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111078&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Yang, Xiaodong Sun; Yang, Lietai&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method based on the measurement of the oxidation power or the cathodic current density using a corrosion-resistant electrode (noble electrode) to derive the bounding corrosion rates of the corroding metal, which is either a stand-alone electrode or an actual component of an equipment, is disclosed. During the measurement, the potential of the noble electrode is controlled at the corrosion potential of the corroding metal. A modified version the sensor that provides a correction factor for ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/x7tDF9YxCPYEtkKXUZVPII0upIA/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/x7tDF9YxCPYEtkKXUZVPII0upIA/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/x7tDF9YxCPYEtkKXUZVPII0upIA/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/x7tDF9YxCPYEtkKXUZVPII0upIA/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/RKARqLCsB20" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8111078/description.html</feedburner:origLink></item>
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			         <title><![CDATA[Method and apparatus for determination of plant canopy rehydration rate and magnitude of plant canopy water storage]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/9dhuTFR-Zz4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111076&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Gensler, William G.&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;This invention is concerned with a method for measuring the canopy rehydration pulse during the period of water application. During the rehydration process water leaks from the trunk xylem tubes into the sapwood extraxyllary region. A water content sensor in this region monitors the magnitude and timing of this leakage water thereby giving a measure of the magnitude and timing of the upward flow of water. The rehydration pulse is quantified by a sequence of measurements of sapwood water ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/iNIxbSSKNdOBiAeIhLZuw8sGCxs/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/iNIxbSSKNdOBiAeIhLZuw8sGCxs/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/iNIxbSSKNdOBiAeIhLZuw8sGCxs/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/iNIxbSSKNdOBiAeIhLZuw8sGCxs/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/9dhuTFR-Zz4" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8111076/description.html</feedburner:origLink></item>
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			         <title><![CDATA[Electronic circuit with capacitive switching ability]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/naKWaFUKPkI/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111075&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Uhov, Andrei; Nikitin, Nikolay; Sazanov, Dmitry&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Electronic circuit for the detection of a capacitive variation on two distinct contact capacitors, (C&lt;b&gt;1&lt;/b&gt;, C&lt;b&gt;2&lt;/b&gt;), comprising means able of squaring the signals generated by a conventional pulse generator and filtered by two filters (R&lt;b&gt;1&lt;/b&gt;, C&lt;b&gt;1&lt;/b&gt;-R&lt;b&gt;2&lt;/b&gt;, C&lt;b&gt;2&lt;/b&gt;), wherein the respective capacitors (C&lt;b&gt;1&lt;/b&gt;, C&lt;b&gt;2&lt;/b&gt;) are the same said contact capacitors which are connected to a respective terminal to a common ground (G); said means are also able to generate ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/pArAm-8u4chztykOtNEB489mzkw/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/pArAm-8u4chztykOtNEB489mzkw/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/pArAm-8u4chztykOtNEB489mzkw/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/pArAm-8u4chztykOtNEB489mzkw/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/naKWaFUKPkI" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Method and apparatus to measure differential phase and frequency modulation distortions for audio equipment]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/p0zbIvnBVLE/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111074&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Quan, Ronald&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dynamic change in frequency response, gain, and or phase. This dynamic test can reveal frequency modulation effects. Another embodiment may include the use of a multiple frequency signal to dynamically induce a time varying phase or ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/7r72IcBREiqZFTt-V1duU1fgGTU/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/7r72IcBREiqZFTt-V1duU1fgGTU/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/7r72IcBREiqZFTt-V1duU1fgGTU/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/7r72IcBREiqZFTt-V1duU1fgGTU/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/p0zbIvnBVLE" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Testing device]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/FSUsi1np0eQ/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111073&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Lin, Po-Yu; Lee, Chao-Chien&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A testing device (&lt;b&gt;100&lt;/b&gt;) includes a main body (&lt;b&gt;20&lt;/b&gt;) for supplying power to an electronic product including a space capable of assembling a battery therein, and a housing (&lt;b&gt;10&lt;/b&gt;). The main body includes a fixing member (&lt;b&gt;22&lt;/b&gt;) and a moving member (&lt;b&gt;24&lt;/b&gt;) movable relative to the fixing member. The housing includes a plurality of supporting posts (&lt;b&gt;14&lt;/b&gt;) for supporting the main body and at least one driving post (&lt;b&gt;18&lt;/b&gt;) for driving the moving member to move ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/FbTWXhscsW5N1tp_hrDeUTQUW4s/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/FbTWXhscsW5N1tp_hrDeUTQUW4s/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/FbTWXhscsW5N1tp_hrDeUTQUW4s/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/FbTWXhscsW5N1tp_hrDeUTQUW4s/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/FSUsi1np0eQ" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Steam cooker and related superheater]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/D9sIWYuOISk/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111072&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Saksena, Atul&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A steam cooker includes a steam generator including a heating chamber defining a volume for holding water. A heat exchanger is associated with the heating chamber so as to generate steam. A steam superheater superheats steam traveling from the heating chamber to a steam cooking ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/vY81SnjAyFDifQCBoKmL9joSylY/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/vY81SnjAyFDifQCBoKmL9joSylY/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/vY81SnjAyFDifQCBoKmL9joSylY/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/vY81SnjAyFDifQCBoKmL9joSylY/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/D9sIWYuOISk" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Battery management system and driving method thereof]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/UEfAc_iK1Jg/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111071&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Choi, Soo-Seok; Lee, Young-Jo; Seo, Se-Wook; Park, Ho-Young; Yun, Han-Seok; Kim, Beom-Gyu; Lim, Gye-Jong; Tae, Yong-Jun&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A sensing and control apparatus for a battery management system is provided. The sensing and control apparatus includes: a sensing unit and a main control unit. The sensing unit includes: a cell relay of a plurality of cell relays and a voltage detection unit. The cell relay is configured to be coupled to at least one of a plurality of cells. The voltage detection unit is coupled to a cell relay. The voltage detection unit is configured to: receive a reference voltage when each of the ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/lkPMhkQWSH9g5TcSTUcLab47gEM/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/lkPMhkQWSH9g5TcSTUcLab47gEM/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/lkPMhkQWSH9g5TcSTUcLab47gEM/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/lkPMhkQWSH9g5TcSTUcLab47gEM/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/UEfAc_iK1Jg" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Magnetic resonance imaging apparatus and magnetic resonance imaging method]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/baIw1vg1QW8/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111070&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Okamoto, Kazuya; Hanawa, Masatoshi; Adachi, Kohei&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A magnetic resonance imaging apparatus includes an imaging condition acquisition unit and an imaging unit. The imaging condition acquisition unit acquires at least one of optimum amplitude and optimum phase of a radio frequency transmission signal so as to reduce a deviation of data in at least one region of interest set in an object. The imaging unit acquires image data by imaging according to an imaging condition including at least one of optimum amplitude and optimum ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/AwbS4ANAr_L93-J_70A7ZEPuoHo/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/AwbS4ANAr_L93-J_70A7ZEPuoHo/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/AwbS4ANAr_L93-J_70A7ZEPuoHo/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/AwbS4ANAr_L93-J_70A7ZEPuoHo/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/baIw1vg1QW8" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Magnetic resonance system and operating method with compensation of second-order maxwell terms]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/dahG6saQyfY/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111069&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Feiweier, Thorsten&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A magnetic resonance system has a basic magnet system that generates a temporally static, spatially homogeneous basic magnetic field in an examination volume of the magnetic resonance system, and a radio-frequency system. An overlay system generates overlay fields in the examination volume that, together with the basic field, form a complete field. The overlay system has at least one first order field system and at least one second order field system. The first order field system generates ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/4LmNK6OOV1hy3VpspKHRIiAF8QU/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/4LmNK6OOV1hy3VpspKHRIiAF8QU/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/4LmNK6OOV1hy3VpspKHRIiAF8QU/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/4LmNK6OOV1hy3VpspKHRIiAF8QU/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/dahG6saQyfY" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Reducing effects of rotational motion]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/BFNvuJA_qvE/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111068&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Wendt, Michael; Lewin, Jonathan S.; Shankaranarayanan, Ajit; Duerk, Jeffrey L.&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method and system for improving image quality by correcting errors introduced by rotational motion of an object being imaged is provided. The object is associated with a fiducial mark. The method provides a computer executable methodology for detecting a rotation and selectively reordering, deleting and/or reacquiring projection ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/qXe3OMECKJRRoQMEdyG_4WO0PtU/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/qXe3OMECKJRRoQMEdyG_4WO0PtU/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/qXe3OMECKJRRoQMEdyG_4WO0PtU/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/qXe3OMECKJRRoQMEdyG_4WO0PtU/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/BFNvuJA_qvE" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Positional magnetic resonance imaging]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/Q1bF3EcHTYs/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111067&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Wolf, Robert; Damadian, Raymond V.&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A patient is examined by magnetic resonance imaging in different positions relative to gravity by moving the patient relative to the magnet, and the acquired data is compared to show differences in anatomy due to differences in patient position. Individual data elements or groups of plural data elements representing particular locations in one set of image data can be compared with data elements associated with the same locations in another set of image data, to yield a set of comparison ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/Bye31PW5tVE01l38o_SZnA0GrSY/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/Bye31PW5tVE01l38o_SZnA0GrSY/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/Bye31PW5tVE01l38o_SZnA0GrSY/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/Bye31PW5tVE01l38o_SZnA0GrSY/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/Q1bF3EcHTYs" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Device and method for measuring the mass of a magnetic material, and analysis apparatus including such device]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/vyShcr9UegM/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111066&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Lenglet, Luc&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The invention relates to a device for measuring the mass of a magnetic material (&lt;b&gt;6&lt;/b&gt;) present in an analysis medium, that comprises: a modulator (&lt;b&gt;24&lt;/b&gt;) of the phase of a high-frequency and/or low-frequency component of a magnetic field for exciting the analysis medium with a modulation signal having a value that is modified by a frequency f&lt;sub&gt;mod&lt;/sub&gt;; and a demodulator (&lt;b&gt;36&lt;/b&gt;) capable of demodulating the amplitude of an amplitude signal, measured in response to the ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/c6B9UTP-yfqOXhd8Z_UVAuAv2sQ/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/c6B9UTP-yfqOXhd8Z_UVAuAv2sQ/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/c6B9UTP-yfqOXhd8Z_UVAuAv2sQ/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/c6B9UTP-yfqOXhd8Z_UVAuAv2sQ/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/vyShcr9UegM" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Sensor unit for a rotary encoder and a rotary encoder equipped with such a sensor unit]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/VEwH6q9XLH8/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111065&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Mehnert, Walter; Theil, Thomas&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;There is described a sensor unit (&lt;b&gt;3&lt;/b&gt;) for a rotary encoder which serves for detecting the rotary movements of a drive shaft (&lt;b&gt;1&lt;/b&gt;) in both directions and which has a single-stage transmission with an input gear (&lt;b&gt;15&lt;/b&gt;) which is arranged concentrically with respect to and is non-rotatably connected to the drive shaft (&lt;b&gt;1&lt;/b&gt;). The sensor unit includes an absolute segment counter which serves for counting the angle segments through which the drive shaft passes within each ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/sCOYFmJZVeSXzxENpqcbFo-ujNY/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/sCOYFmJZVeSXzxENpqcbFo-ujNY/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/sCOYFmJZVeSXzxENpqcbFo-ujNY/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/sCOYFmJZVeSXzxENpqcbFo-ujNY/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/VEwH6q9XLH8" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Magnetic rotational angle transducer]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/3sY1-m5_V3o/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111064&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Wagner, Matthias; Wiese, Peter&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A magnetic rotational angle transducer has at least one Hall sensor (&lt;b&gt;14&lt;/b&gt;) rotatable in a magnetic field of a given configuration relative to and offset from the rotational axis (&lt;b&gt;16&lt;/b&gt;). To enable linearization of the output signal without additional signal processing over a large range of rotational angles, it is proposed that the Hall sensor is aligned radially and axially to the rotational axis (&lt;b&gt;16&lt;/b&gt;) and lies in a central position parallel to the field lines of the ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/bXDk3Td3028MxnWebBGSfIoF1hA/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/bXDk3Td3028MxnWebBGSfIoF1hA/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/bXDk3Td3028MxnWebBGSfIoF1hA/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/bXDk3Td3028MxnWebBGSfIoF1hA/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/3sY1-m5_V3o" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Magnetic rotation sensing]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/nEtCfj4vIDo/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111063&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Graff, Tyler A.&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Embodiments for rotation sensing are provided. The device may include a magnet apparatus comprising a magnet, the magnet apparatus configured to be coupled to a dial apparatus of a meter. Also included may be a magnetic field sensor configured to be coupled to a dial cover. When the magnet apparatus is coupled to the dial apparatus and the magnetic field sensor is coupled to the dial cover, the distance between the magnet and the magnetic field sensor may be a function of the strength of ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/wDhSsOsu0iCKOhRBifR7s1yHoAk/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/wDhSsOsu0iCKOhRBifR7s1yHoAk/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/wDhSsOsu0iCKOhRBifR7s1yHoAk/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/wDhSsOsu0iCKOhRBifR7s1yHoAk/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/nEtCfj4vIDo" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Low mass driveshaft speed sensor assembly]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/wQg-_Non1yg/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111062&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Hollman, Timothy M.; Lamicq, Olivier J.; Taft, Kevin K.&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A speed sensor assembly comprises: a driveshaft with a driveshaft axis, a sensing portion of the driveshaft having an axial bore along the driveshaft axis and multiple axial slots radially spaced around the sensing portion that penetrate through the driveshaft into the axial bore; and at least one electromagnetic sensor with a magnetic circuit proximate the sensing portion of the driveshaft; wherein rotation of the driveshaft causes the slots in the sensing portion to sequentially pass ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/gFH6tJd5U3HGdA-6c42eomQWxX8/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/gFH6tJd5U3HGdA-6c42eomQWxX8/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/gFH6tJd5U3HGdA-6c42eomQWxX8/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/gFH6tJd5U3HGdA-6c42eomQWxX8/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/wQg-_Non1yg" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Multi-output determination circuit]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/hvVYUpEs1xI/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111061&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Suzuki, Kouji; Takebayashi, Kenichi; Senoo, Kazutaka&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An embodiment of the present invention provides a multi-output determination circuit that determines whether or not any one input voltage of a plurality of input voltages is equal to or higher than an upper-limit voltage value. This multi-output determination circuit includes a first diode-OR, upper-limit reference voltage generation means, and a first comparator. The first diode-OR includes a plurality of first diodes whose anodes are each connected to a respective one of the plurality of ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/Gzxj7KV3AGcbfzYHN46KUl5uqIU/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/Gzxj7KV3AGcbfzYHN46KUl5uqIU/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/Gzxj7KV3AGcbfzYHN46KUl5uqIU/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/Gzxj7KV3AGcbfzYHN46KUl5uqIU/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/hvVYUpEs1xI" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Precision AC current measurement shunts]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/kXuaDsdrOK0/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111060&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Perras, Andre C.&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A more precise and cost effective means than previously commercially available for measuring alternating currents up to 100 amperes in the frequency range from direct current to 100 kilohertz can be measured with precision approaching 0.001% employs a shield around a resistive network. The shield is electrically isolated from the resistive network, but acts as a heat sink to draw heat generated by the resistive network away, promoting fast stabilization times. The shield also provides ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/MziduaZHvBBVYXpuk7blb-4cjEc/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/MziduaZHvBBVYXpuk7blb-4cjEc/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/MziduaZHvBBVYXpuk7blb-4cjEc/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/MziduaZHvBBVYXpuk7blb-4cjEc/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/kXuaDsdrOK0" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Electric current locator]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/Mt7XvkeO3GY/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8111059&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-02-07&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;King, Paul E.; Woodside, Charles Rigel&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The disclosure herein provides an apparatus for location of a quantity of current vectors in an electrical device, where the current vector has a known direction and a known relative magnitude to an input current supplied to the electrical device. Mathematical constants used in Biot-Savart superposition equations are determined for the electrical device, the orientation of the apparatus, and relative magnitude of the current vector and the input current, and the apparatus utilizes magnetic ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/vApiTUHsV0TBowmQ47ajOTOsOzk/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/vApiTUHsV0TBowmQ47ajOTOsOzk/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/vApiTUHsV0TBowmQ47ajOTOsOzk/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/vApiTUHsV0TBowmQ47ajOTOsOzk/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/Mt7XvkeO3GY" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Two pole circuit breaker voltage monitoring integration]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/78QSbSv-ymg/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106670&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Drame, Issa; Gass, Randall J.&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An apparatus for monitoring line voltage in a circuit breakor includes a controller configured to calculate a voltage difference between the neutral voltage and the AC line voltage of positive polarity based on a first signal and a second signal and assign, using a polarity signal, the voltage difference value to the AC line voltage of positive polarity and the second signal to the AC line voltage of negative polarity. Because the AC line voltage of positive polarity can be calculated based ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/vVE0J_pfIxPVNvvXD-jI5JSYNfA/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/vVE0J_pfIxPVNvvXD-jI5JSYNfA/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/vVE0J_pfIxPVNvvXD-jI5JSYNfA/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/vVE0J_pfIxPVNvvXD-jI5JSYNfA/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/78QSbSv-ymg" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[High current precision resistance measurement system]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/YgrnmgumTqw/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106669&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Perras, Andre C; Evans, Mark&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A resistance testing apparatus makes use of a modular design for cascaded, parallel, bipolar current sources to obviate the need for electromechanical or pneumatic switching ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/lu_3QMo3yKb9uwwMMBNnLXdZodw/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/lu_3QMo3yKb9uwwMMBNnLXdZodw/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/lu_3QMo3yKb9uwwMMBNnLXdZodw/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/lu_3QMo3yKb9uwwMMBNnLXdZodw/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/YgrnmgumTqw" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Proximity detector and proximity detecting method]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/U34cKMlQpAM/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106668&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Matsushima, Kenichi&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A proximity detector detects the approach of an object based on a stray capacitance. A differential electrode has an apparent stray capacitance that varies in response to an approaching object. An individual capacitance detector detects an individual stray capacitance of the differential electrode based on a stray capacitance of the differential electrode obtained by repeatedly charging and discharging the differential electrode in opposite phases and based on a stray capacitance of the ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/zSm7R_LoT8zo7QLD-KYSWrdZQMM/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/zSm7R_LoT8zo7QLD-KYSWrdZQMM/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/zSm7R_LoT8zo7QLD-KYSWrdZQMM/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/zSm7R_LoT8zo7QLD-KYSWrdZQMM/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/U34cKMlQpAM" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Insulation measurement apparatus]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/fiQ76STNuMg/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106667&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Tsurumi, Takafumi; Kawamura, Yoshihiro; Uchida, Shintaro&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An insulation measurement apparatus includes a path including a first resistor, a capacitor electrically floated from a ground, and a second resistor between a positive to a negative electrode side of a power supply, a first switching element between the power supply positive electrode side and the capacitor, a second switching element between the capacitor and the power supply negative electrode side, a detection section detecting a charge voltage on the capacitor and determining a power ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/YbuMN2s3BZnn5HR62gq5rfPrY8Q/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/YbuMN2s3BZnn5HR62gq5rfPrY8Q/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/YbuMN2s3BZnn5HR62gq5rfPrY8Q/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/YbuMN2s3BZnn5HR62gq5rfPrY8Q/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/fiQ76STNuMg" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Testing an electrical component]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/13SjXthgCH0/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106666&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Cases, Moises; Ahmed, Rubina F.; Herrman, Bradley D.; Seidel, Peter R.; Patel, Pravin; Mutnury, Bhyrav M.&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Testing an electrical component, the component including a printed circuit board (‘PCB’) with a number of traces, the traces organized in pairs with each trace of a pair carrying current in opposite directions and separated from one another by a substrate layer of the PCB, where testing of the electrical component includes: dynamically and iteratively until a present impedance for a pair of traces of the component is greater than a predetermined threshold impedance: increasing, by an ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/5TlSFDQs8rTZ4OYaiWIvTL79ql4/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/5TlSFDQs8rTZ4OYaiWIvTL79ql4/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/5TlSFDQs8rTZ4OYaiWIvTL79ql4/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/5TlSFDQs8rTZ4OYaiWIvTL79ql4/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/13SjXthgCH0" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[3-D mapping focused beam failure analysis]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/uHjAXZyTl5g/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106665&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Patterson, Joseph Martin&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A reflector tool and a method are provided for three-dimensional integrated circuit (IC) failure analysis. An IC (die) has top and bottom surfaces, a perimeter, and a first side. The IC is electrically connected to a current sensing amplifier. The first side of the IC is scanned in the X plane with an infrared laser beam while changes in IC current flow are sensed. The sensed current changes are cross-referenced to the location of the infrared laser beam in the X plane. In one aspect, a ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/PSjl7Ze4qDXeqywSRs4VaOABefg/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/PSjl7Ze4qDXeqywSRs4VaOABefg/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/PSjl7Ze4qDXeqywSRs4VaOABefg/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/PSjl7Ze4qDXeqywSRs4VaOABefg/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/uHjAXZyTl5g" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[System and method for conducting accelerated soft error rate testing]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/TpucNt7uOq4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106664&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Chang, Jung-Che; Chien, Wei-Ting&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An apparatus for a user to conduct an accelerated soft error test (ASER) on a semiconductor sample is provided. The apparatus comprises a first component for holding the radiation source, where the radiation source may be either an alpha-particle or neutron-particle source. The apparatus comprises a second component for holding the semiconductor sample, where the semiconductor sample may be either a silicon wafer or semiconductor chip. The apparatus comprises a connecting assembly for ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/QbH46ik0KOmm7bWMrxeZKNyfsnw/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/QbH46ik0KOmm7bWMrxeZKNyfsnw/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/QbH46ik0KOmm7bWMrxeZKNyfsnw/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/QbH46ik0KOmm7bWMrxeZKNyfsnw/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/TpucNt7uOq4" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Sensor product for electric field sensing]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/4KCSIqFoiXY/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106663&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Joutsenoja, Timo; Kyyny, Kari&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A sensor product web for electric field sensing. The sensor includes a substrate, sequential electrically conductive areas on a surface of the substrate, conductors, an output connected to one of the electrically conductive areas by one of the conductors, a dielectric layer arranged on top of the conductors, and an electrically conductive layer arranged on top of the dielectric layer on a same surface of the substrate as the electrically conductive areas, the dielectric layer being ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/Icv8wEpiWPlfnMS7EQ6BWI44cPA/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/Icv8wEpiWPlfnMS7EQ6BWI44cPA/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/Icv8wEpiWPlfnMS7EQ6BWI44cPA/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/Icv8wEpiWPlfnMS7EQ6BWI44cPA/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/4KCSIqFoiXY" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Sensor product for electric field sensing]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/iscZ6uCanpo/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106662&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Joutsenoja, Timo; Kyyny, Kari&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A sensor product web for electric field sensing. The sensor includes a substrate, sequential electrically conductive areas on a surface of the substrate, conductors, an output connected to the electrically conductive areas by one of the conductors, and a via extending through the substrate, forming an electrically conductive path connecting the electrically conductive areas to the output by the conductor on a reverse surface of the ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/p3sb1omyl941Rg_UrI4_aSW1mW8/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/p3sb1omyl941Rg_UrI4_aSW1mW8/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/p3sb1omyl941Rg_UrI4_aSW1mW8/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/p3sb1omyl941Rg_UrI4_aSW1mW8/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/iscZ6uCanpo" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Battery apparatus for controlling plural batteries and control method of plural batteries]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/408oDSnfgXU/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106661&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Kai, Tsuyoshi; Miyazaki, Hideki; Emori, Akihiko; Kudo, Akihiko&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Lower order control devices control plural battery cells configuring plural battery modules. An input terminal of the low order control device in the highest potential, an output terminal of the low order control device in the lowest potential, and a high order control device are connected by isolating units, photocouplers. Diodes which prevent a discharge current of the battery cells in the battery modules are disposed between the output terminal of the low order control device and the ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/NAxMksRjyPzj90GS_B__VxgzCcM/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/NAxMksRjyPzj90GS_B__VxgzCcM/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/NAxMksRjyPzj90GS_B__VxgzCcM/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/NAxMksRjyPzj90GS_B__VxgzCcM/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/408oDSnfgXU" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Sonde array for use with buried line locators]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/KinDtuJBpfk/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106660&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Olsson, Mark S.; Merewether, Ray&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A sonde array that is useful in locating buried utilities includes at least three substantially mutually orthogonal antennas. Each antenna includes a substantially cylindrical ferromagnetic core, an insulating layer surrounding the core, and a length of a conductor wrapped around the insulating layer to form a coil. The coils of the antennas are substantially ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/_ztLEoA90Av8933nm4Mk3Fepj5Q/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/_ztLEoA90Av8933nm4Mk3Fepj5Q/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/_ztLEoA90Av8933nm4Mk3Fepj5Q/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/_ztLEoA90Av8933nm4Mk3Fepj5Q/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/KinDtuJBpfk" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[In situ measurements in formation testing to determine true formation resistivity]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/7yHwCRnN_v4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106659&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;McGregor, M. Douglas&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A borehole formation testing system that measures resistivity of near borehole formation in situ rather than the measuring resistivity of fluid drawn into a formation tester tool. A radially extendable probe assembly contacts and forms a hydraulic seal with the wall of a borehole using a pad. Electrode contacts are disposed on the contact surface of the pad and electrically contact the near borehole formation. Response of the electrode contacts are used to determine resistivity of the near ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/RwM02LRaHsRtyiLw1Y0zjHZIM1c/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/RwM02LRaHsRtyiLw1Y0zjHZIM1c/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/RwM02LRaHsRtyiLw1Y0zjHZIM1c/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/RwM02LRaHsRtyiLw1Y0zjHZIM1c/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/7yHwCRnN_v4" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Identification code circuit for receiving coil in magnetic resonance imaging system]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/uRqNAdBQAOM/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106658&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Zhu, Hua Bin; Wang, Jian Min&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An identification code circuit for a receiving coil in a magnetic resonance imaging system, is embodied in a main coil. The circuit has a fixed resistance for generating the identification code of the main coil. The main coil has a socket for connecting a sub-coil, so that a coil plug of a sub-coil can be plugged into the socket for connecting to the main coil. The identification code circuit also has a regulating resistance and a sub-coil switch corresponding to the socket. The coil plug ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/bv6UpxTec08TnjVAqdAtdLT9I9I/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/bv6UpxTec08TnjVAqdAtdLT9I9I/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/bv6UpxTec08TnjVAqdAtdLT9I9I/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/bv6UpxTec08TnjVAqdAtdLT9I9I/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/uRqNAdBQAOM" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Apparatus for high-resolution NMR spectroscopy and/or imaging with an improved filling factor and RF field amplitude]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/P6GSwA2ZxpY/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106657&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Sakellariou, Dimitrios; Jacquinot, Jacques-François&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The present invention concerns an apparatus (&lt;b&gt;1&lt;/b&gt;′) for NMR spectroscopy and/or NMR imaging of a sample. The apparatus comprises a static probe comprising an outer coil for excitation of nuclei of the sample by generating an incident radio frequency field at the Larmor frequency of the nuclei, and for reception of a return radio frequency field emitted by the sample, and a sensitive inner coil (&lt;b&gt;6&lt;/b&gt;&lt;i&gt;a&lt;/i&gt;′) which is mounted closely around or in contact with the sample ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/7Yzsq2jF9XiI6JYtuBY6eEA6Hnw/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/7Yzsq2jF9XiI6JYtuBY6eEA6Hnw/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/7Yzsq2jF9XiI6JYtuBY6eEA6Hnw/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/7Yzsq2jF9XiI6JYtuBY6eEA6Hnw/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/P6GSwA2ZxpY" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Superconducting loop, saddle and birdcage MRI coils]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/nnv2OppYTl8/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106656&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Nesteruk, Krzysztof; Xie, Lei Ming P; Wosik, Jaroslaw&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;New MRI coil and resonators are disclosed based solely on superconducting inductive element and built-in capacitive elements as well as hybrid superconducting-metal inductive and capacitive elements having superior SNR. Single and multiple small animal MRI imaging units are also disclosed including one or more resonators of this invention surrounding one or more small animal cavities. Methods for making and using the MRI coils and/or arrays are also ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/lFtpTxdv2mDPQFFLl5D90lRsomM/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/lFtpTxdv2mDPQFFLl5D90lRsomM/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/lFtpTxdv2mDPQFFLl5D90lRsomM/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/lFtpTxdv2mDPQFFLl5D90lRsomM/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/nnv2OppYTl8" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Multiplex imaging systems, devices, methods, and compositions including ferromagnetic structures]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/ynwhLq1yU04/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106655&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Kare, Jordin T.; Kindsvogel, Wayne R.; Hyde, Roderick A.&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Multiplex imaging systems, devices, methods, and compositions are provided. A nuclear magnetic resonance imaging composition includes, but is not limited to, a plurality of ferromagnetic microstructures configured to generate a time-invariant magnetic field within at least a portion of one or more internal surface-defined ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/Gwsyman0KIQ2IKwQY8DWbHM6L6E/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/Gwsyman0KIQ2IKwQY8DWbHM6L6E/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/Gwsyman0KIQ2IKwQY8DWbHM6L6E/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/Gwsyman0KIQ2IKwQY8DWbHM6L6E/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/ynwhLq1yU04" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Magnetic sensor integrated circuit device and method]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/WrQxzOMovO4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106654&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Wietschorke, Helmut; Theuss, Horst&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An sensor includes a substrate with a magnetic field sensor mounted on the substrate. The magnetic field sensor has a first surface defining a plane. A magnetic flux conducting member has a second surface that is not parallel to the first surface. A non-magnetic member is situated between the magnetic field sensor and the magnetic flux conducting ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/GoBtat9UxN8t01k1gNZRw4f7mQc/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/GoBtat9UxN8t01k1gNZRw4f7mQc/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/GoBtat9UxN8t01k1gNZRw4f7mQc/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/GoBtat9UxN8t01k1gNZRw4f7mQc/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/WrQxzOMovO4" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Optical-magnetic Kerr effect waveform testing]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/LBJ3hHmXAG8/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106653&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Patterson, Joseph Martin&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;System and methods are provided for optical-magnetic Kerr effect signal analysis. In one aspect, a test fixture is supplied having parallel conductive lines, with an input of a first line adjacent a resistively loaded output of a second line and a resistively loaded output of the first line adjacent an input of the second line. An optically transparent test region is interposed between the conductive lines, and a metallic reflector underlies the test region. A signal reference is supplied ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/sENsGgOgW5EzoKkOV-01141UOgQ/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/sENsGgOgW5EzoKkOV-01141UOgQ/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/sENsGgOgW5EzoKkOV-01141UOgQ/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/sENsGgOgW5EzoKkOV-01141UOgQ/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/LBJ3hHmXAG8" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Apparatus for magnetizing a magnetizable element]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/nHnuaRNMgd4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106652&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;May, Lutz&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An apparatus is for magnetizing a magnetizable element to generate magnetically encoded regions. The apparatus includes electric connection elements for electrically contacting at least two different portions of the magnetizable element. The apparatus also includes an electric signal supply unit connected to the electric connection elements and adapted for applying at least two different electric signals to the at least two different portions so as to generate at least two different ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/iN7JyJsbRoe4KuUkVMt_z5zN9vI/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/iN7JyJsbRoe4KuUkVMt_z5zN9vI/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/iN7JyJsbRoe4KuUkVMt_z5zN9vI/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/iN7JyJsbRoe4KuUkVMt_z5zN9vI/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/nHnuaRNMgd4" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Methods and apparatuses for determining thickness of a conductive layer]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/UrBTmcN4uRU/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106651&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Franzen, Paul; Lahiri, Sudeep Kumar&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Methods and apparatuses for calibrating eddy current sensors. A calibration curve is formed relating thickness of a conductive layer in a magnetic field to a value measured by the eddy current sensors or a value derived from such measurement, such as argument of impedance. The calibration curve may be an analytic function having infinite number terms, such as trigonometric, hyperbolic, and logarithmic, or a continuous plurality of functions, such as lines. High accuracy allows the omission ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/xac8zIHnxUTSdZ3cLAyu3p402LE/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/xac8zIHnxUTSdZ3cLAyu3p402LE/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/xac8zIHnxUTSdZ3cLAyu3p402LE/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/xac8zIHnxUTSdZ3cLAyu3p402LE/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/UrBTmcN4uRU" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[System and method for measuring movement of a component from rings magnetized in a magnetically hard layer]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/cqsNxCZfKqw/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106650&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Arns, Donald C.; Garcia, Pablo&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A position-sensing system includes a first component (e.g., a cylinder) and a second component (e.g., a piston rod) movably coupled to the first component for movement with respect thereto. A magnetically hard layer on the second component provides a recording medium. Regions of the magnetically hard layer are magnetized as magnetized rings around the second component. Magnetic-field sensors are coupled to the first component in proximity of the magnetically hard layer on the second ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/OLAwbPGa0PPaf91_LQcfJwhpABw/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/OLAwbPGa0PPaf91_LQcfJwhpABw/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/OLAwbPGa0PPaf91_LQcfJwhpABw/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/OLAwbPGa0PPaf91_LQcfJwhpABw/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/cqsNxCZfKqw" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Angle detecting apparatus and angle detecting method]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/_6LUY1mMV7A/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106649&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Kido, Toshinao; Miyamoto, Hirokazu; Kaita, Yoshio&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An angle detecting apparatus includes a rotor fixed to a rotating shaft, a pair of magnetic sensors arranged opposite each other so as to output a first detection signal and a second detection signal, respectively, each of which contains information on the angle of rotation of the rotor, a differential operational circuit performing differential operation on the first detection signal and the second detection signal, and an angle calculating circuit calculating the angle of rotation of the ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/gNkG_P4CMNTHYcygiiErylLrU1s/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/gNkG_P4CMNTHYcygiiErylLrU1s/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/gNkG_P4CMNTHYcygiiErylLrU1s/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/gNkG_P4CMNTHYcygiiErylLrU1s/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/_6LUY1mMV7A" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Non-contact rotational angle detecting sensor]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/Q9wg7iHTvGQ/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106648&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Sato, Shunichi&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;There is provided a non-contact rotational detecting sensor comprising a ring-shaped permanent magnet which rotates integrally with a detection object of a rotational angle and of which a magnetic pole changes along the circumferential direction, a ring-shaped inside magnetic flux collecting yoke for surrounding an outer peripheral surface of the ring-shaped permanent magnet in a constant gap, a ring-shaped outside magnetic flux collecting yoke for surrounding an outer peripheral surface of ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/mlS2sAmWGAWGo4nu5QRTMeEj4v0/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/mlS2sAmWGAWGo4nu5QRTMeEj4v0/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/mlS2sAmWGAWGo4nu5QRTMeEj4v0/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/mlS2sAmWGAWGo4nu5QRTMeEj4v0/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/Q9wg7iHTvGQ" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Rotation sensor]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/B8H2vbs8Rtw/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106647&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Oohira, Satoshi&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A rotation sensor for detecting rotation of an object includes a semiconductor substrate, a vertical Hall element, and a magnetoresistive element. The vertical Hall element is formed in the semiconductor substrate to detect a magnetic field parallel to a surface of the semiconductor substrate. The vertical Hall element outputs a detection signal corresponding to the detected magnetic field. The magnetoresistive element is formed on the surface of the semiconductor substrate and has a ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/JxgYoPbfZGZwyTBFJH7Uz_jV_bc/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/JxgYoPbfZGZwyTBFJH7Uz_jV_bc/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/JxgYoPbfZGZwyTBFJH7Uz_jV_bc/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/JxgYoPbfZGZwyTBFJH7Uz_jV_bc/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/B8H2vbs8Rtw" height="1" width="1"/&gt;</description>
			         
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<item>
			         <title><![CDATA[Sensor circuit]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/uuq28qd0jOs/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8106646&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-31&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Ariyama, Minoru&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Provided is a sensor circuit that is small in circuit scale, but is capable of temperature compensation. A reference voltage circuit (BL&lt;b&gt;1&lt;/b&gt;) which compensates a temperature includes only a voltage divider circuit, and hence the sensor circuit is small in circuit scale. The sensor circuit is also capable of temperature compensation because temperature changes of a reference voltage (VTH&lt;b&gt;1&lt;/b&gt;) and a reference voltage (VTH&lt;b&gt;2&lt;/b&gt;) match a temperature change of an output signal (OUTA) ...&lt;br /&gt;
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&lt;a href="http://feedads.g.doubleclick.net/~a/jyxU912sPf3vNkrDqEjNS4ST2BQ/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/jyxU912sPf3vNkrDqEjNS4ST2BQ/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/uuq28qd0jOs" height="1" width="1"/&gt;</description>
			         
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<item>
			         <title><![CDATA[Measuring electrical impedance at various frequencies]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/rxhXUm3wMU8/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8102183&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-24&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Orr, Timothy&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A logarithmic level detector (&lt;b&gt;9&lt;/b&gt;) produces analog signals that represent logarithms of the voltage across, and current through, a target device (&lt;b&gt;7&lt;/b&gt;). These signals are then passed to a processor (&lt;b&gt;1&lt;/b&gt;) that performs a digital conversion. Because the digital conversion takes place after logarithmic conversion, it becomes possible to obtain an appropriate resolution for all signal levels, and a calculation of impedance of a target device, with reduced error, is ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/InwSTFneCOh7K-TYbYc4XGPPcIc/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/InwSTFneCOh7K-TYbYc4XGPPcIc/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/InwSTFneCOh7K-TYbYc4XGPPcIc/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/InwSTFneCOh7K-TYbYc4XGPPcIc/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/rxhXUm3wMU8" height="1" width="1"/&gt;</description>
			         
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<item>
			         <title><![CDATA[Systems and methods for measuring the electrical properties of a microparticle]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/QzOnf4ccbrI/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8102182&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-24&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Rabbitt, Richard D.; Dharia, Sameera&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method of measuring the electrical properties of a microparticle is provided, which can include multiple steps. Steps can include situating the microparticle within an array of electrodes submerged in a conductive medium so that the microparticle and electrodes are in electrical communication when the electrodes are energized, and delivering an electrical signal into the medium from one electrode to an immediately adjacent electrode. High frequency signals can be used to penetrate the ...&lt;br /&gt;
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&lt;a href="http://feedads.g.doubleclick.net/~a/6R8Gsk7OjWyyajUgwV6vtjbjlB0/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/6R8Gsk7OjWyyajUgwV6vtjbjlB0/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/QzOnf4ccbrI" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Method and device for rapid non-destructive quality control of powdered materials]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/TCayoUgJieU/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8102181&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-24&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;Wilson, Bary; Redko, Volodymyr I; Shembel, Elena M; Khandetskyy, Volodymyr S; Sivtsov, Dmytro I; Pastushkin, Tymofiy V; Redko, Oxana&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Method and related device intended for rapid non-destructive testing of powdered materials with low electric conductivity such as cement and cement-based compositions through determination of their electrical properties. The invention involves an electromagnetic method, including an electronic circuit for generating an electric field in a capacitance probe that is inserted into the powder to be tested. Electrical properties of powdered materials are determined on the basis of a set of the ...&lt;br /&gt;
&lt;p&gt;&lt;a href="http://feedads.g.doubleclick.net/~a/dkNv4CIDBzrB_CLtS2BM60xPqaY/0/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/dkNv4CIDBzrB_CLtS2BM60xPqaY/0/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;br/&gt;
&lt;a href="http://feedads.g.doubleclick.net/~a/dkNv4CIDBzrB_CLtS2BM60xPqaY/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/dkNv4CIDBzrB_CLtS2BM60xPqaY/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/TCayoUgJieU" height="1" width="1"/&gt;</description>
			         
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<item>
			         <title><![CDATA[CPU voltage testing system and method thereof]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~3/OPIeXeIiC6g/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8102180&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2012-01-24&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;Chen, Cheng-Chi&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A CPU voltage testing system and method uses a parameter storing unit to store a number of VID codes and a plurality of allowable voltage ranges. A number of VID code control signals corresponding to the number of the VID codes are sent to a VID code coding unit to control a voltage converting module to output corresponding voltage signals to a CPU. A voltage collecting unit collects CPU core voltages of the CPU and outputs the collected CPU core voltages to a data processing unit. The data ...&lt;br /&gt;
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&lt;a href="http://feedads.g.doubleclick.net/~a/upKpR_jHWzyOQRmnly3mdh3vTKw/1/da"&gt;&lt;img src="http://feedads.g.doubleclick.net/~a/upKpR_jHWzyOQRmnly3mdh3vTKw/1/di" border="0" ismap="true"&gt;&lt;/img&gt;&lt;/a&gt;&lt;/p&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-ElectricityMeasuringAndTesting/~4/OPIeXeIiC6g" height="1" width="1"/&gt;</description>
			         
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