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		    <title>PatentStorm -&gt; Patents -&gt; Data processing: measuring, calibrating, or testing</title>
		    <link>http://www.patentstorm.us/rss/class/patents/rss-702.xml</link>
		    <description>Recent patents filings in USPTO Class 702 Data processing: measuring, calibrating, or testing.</description>
		    <pubDate>Tue, 21 May 2013 16:06:57</pubDate>
		    <managingEditor>patents@patentstorm.us</managingEditor>
		    <language>en</language><atom10:link xmlns:atom10="http://www.w3.org/2005/Atom" rel="self" type="application/rss+xml" href="http://feeds.feedburner.com/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting" /><feedburner:info uri="patentstorm-patents-dataprocessingmeasuringcalibratingortesting" /><atom10:link xmlns:atom10="http://www.w3.org/2005/Atom" rel="hub" href="http://pubsubhubbub.appspot.com/" /><item>
			         <title><![CDATA[Trimming of operative parameters in electronic devices based on corrections mappings]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/vgKsU0Y3-v4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447571&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An embodiment of an electronic device having a plurality of operative parameters is provided. The electronic device includes means for applying a plurality of trimming actions to each parameter for causing a corresponding correction of the parameter, for at least one reference parameter, means for measuring the reference parameter responsive to the application of at least part of the trimming actions, and means for forcing the application of the selected trimming action for the reference ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/vgKsU0Y3-v4" height="1" width="1"/&gt;</description>
			         
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<item>
			         <title><![CDATA[Predictive sensor readout]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/dfcvfpBozak/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447570&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A predictive sensor readout is suitable for coupling to a sensor. The predictive sensor readout includes a sampling circuit, a predictor, and a preset circuit. The sampling circuit is configured to receive and over-sample previously digitized samples of signals previously input from the sensor. The predictor is coupled to the sampling circuit and is configured to receive the over-sampled digitized samples into a signal history and to generate a predicted input from the sensor based on the ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/dfcvfpBozak" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8447570/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Determining sustainability of a data center]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/4jJ1GQAAYvE/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447569&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; ; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Determining a sustainability impact for available data center architectures. A data center is accessed by a computer. Two or more functional parameters of the data center are then evaluated by the computer. Then, the computer combines the two or more evaluated functional parameters into a quantified judgment to determine a sustainability impact of available architectures of the data ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/4jJ1GQAAYvE" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[System and method for analyzing and reporting machine operating parameters]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/PlciWUI04MA/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447568&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A system and method for analyzing and providing exception-based reports for machine data. The machine data is relayed to a remote system for automated analysis based on tests and parameters defined by an owner. If any exceptions are detected in the data based on the operator-defined input, output is generated. The output may take the form of exception-based printed or electronic reports, or the exception information may be relayed to a hand held device, preferably maintained by service ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/PlciWUI04MA" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Measuring line performance]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/8MSnIH4OVBo/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447567&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method of measuring the performance of a DSL line provides an indication of potential faults in the line. Analysis of broadband DSL is less straightforward than for other technologies, since “normal” behavior depends on a number of factors, including line length and line quality, where normal behavior for a long line could be regarded as poor for a short line. The data transmission characteristics of a DSL line under test are measured with reference to its upstream line attenuation, ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/8MSnIH4OVBo" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Mounting condition determining method]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/WxwzM_RTufE/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447566&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A mounting condition determining method including: obtaining mounting information including information related to component mounting operations scheduled to be performed by a mounter (S&lt;b&gt;1&lt;/b&gt;); judging, using the mounting information obtained in the obtaining: which production mode between a synchronous mode and an asynchronous mode is suitable for the scheduled component mounting operations; or which production mode between an alternating mode and an independent mode is suitable for the ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/WxwzM_RTufE" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Approximate error conjugation gradient minimization methods]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/JJ1_ayY0xpI/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447565&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;In one embodiment, a method includes selecting a subset of rays from a set of all rays to use in an error calculation for a constrained conjugate gradient minimization problem, calculating an approximate error using the subset of rays, and calculating a minimum in a conjugate gradient direction based on the approximate error. In another embodiment, a system includes a processor for executing logic, logic for selecting a subset of rays from a set of all rays to use in an error calculation ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/JJ1_ayY0xpI" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Systems and method for power plant performance reconciliation]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/YxGngm0K79w/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447564&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method and system for determining the overall performance of a power plant are provided. The system includes a plurality of components including a processor configured to generate a first reference model of the power plant and generate a first measured model of the power plant. The processor is further configured to determine the performance impact of the at least one of the plurality of components of the power plant on the overall thermal performance of the power plant, normalize the ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/YxGngm0K79w" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Method and system for determination of detection probability or a target object based on a range]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/RpkZF8XrJ9g/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447563&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A simulation system for predicting a likelihood of whether a target object positioned in an environment will be detected by a detection system when illuminated by a laser source. The simulation system may be used for a laser rangefinder application and a laser designator application. The simulation system may provide a detection probability of the target object at a specified range to the detection system or a plurality of detection probabilities as a function of the range to the detection ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/RpkZF8XrJ9g" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Inspection apparatus and method using penetrating radiation]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/aDVgMkWm7Kg/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447562&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method of determining a parameter of an object using penetrating radiation such as X-rays. The parameter of the object could be weight or mass or volume. The method comprises the step of passing the penetrating radiation through the object; determining a first value derived from the total energy of penetrating radiation absorbed by the object; determining a second value related to the mean energy per unit area of penetrating radiation absorbed by the object and determining the parameter ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/aDVgMkWm7Kg" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Shape measurement method of synthetically combining partial measurements]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/7xcmxvPVXiM/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447561&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Coordinate transformation parameters are adopted at the time of synthetically combining partial measurement data so as to eliminate the setting error that can get in when a workpiece is set in position on a measuring machine. Then, a shape parameter is adopted to estimate the approximate error shape of the entire workpiece and the approximate error shape is removed from the measurement data. As a result, the residuals are reduced if the measurement data are those of three-dimensional ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/7xcmxvPVXiM" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Apparatus and method for identifying the absolute rotation of a rotating imaging system]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/q7msBOAUaoQ/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447560&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A rotating imaging system has a rotating portion, an idler, at least one sensor, a tilt sensor and a processor. The rotating portion has a diameter and rotates about a central axis. The idler rotates about an axis parallel to the central axis, and has a second diameter that is smaller than the diameter of the rotating portion. The rotating portion and the idler engage with each other such that both rotate simultaneously. The at least one sensor detects flags on the idler as the idler ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/q7msBOAUaoQ" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Systems and methods for an impact location and amplitude sensor]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/m5E8Mvi5SkY/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447559&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An impact location and amplitude sensory system is provided. Such an impact sensory system may be useful in conjunction with gaming, education, as a control and feedback mechanism for virtually any surface. One embodiment of the impact sensory system may include at least one sensor and a signal processor. The sensor(s) may couple to the object. Sensors may include any of microphones and accelerometers. The sensor(s) receive an impact wave from an impact to the object, either as a ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/m5E8Mvi5SkY" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Information processor and cooling performance determination method]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/n_WMAm0SmPA/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447558&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;According to one embodiment, an information processing apparatus, includes a heat generator on the printed-circuit board in the housing, a heat radiator in the housing configured to radiate heat of the heat generator to the outside of the housing, a first thermometer configure to sense a first temperature at a first position on the board, a second thermometer on the board configured to sense a second temperature at a second position away from the heat generator than the first position, a ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/n_WMAm0SmPA" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Circuits and methods for generating a self-test of a magnetic field sensor]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/HELp0KhJItY/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447556&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; ; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A magnetic field sensor includes built in self-test circuits that allow a self-test of most of, or all of, the circuitry of the magnetic field sensor, including self-test of a magnetic field sensing element used within the magnetic field sensor, while the magnetic field sensor is functioning in normal ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/HELp0KhJItY" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Method for increasing the availability of displacement/position measuring systems on the basis of potentiometers with a slider tap]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/gWUe8mlvjkQ/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447555&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The disclosure relates to a method for increasing the availability of displacement/position measuring systems on the basis of potentiometers with a slider tap in a closed control loop, the controller of which is formed by a microcontroller which is supplied with the position of the slider via an analog/digital converter. At least part of the sensor range of the potentiometer is scanned on request by presetting a sequence of manipulated variables and an available control loop variable which ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/gWUe8mlvjkQ" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[System, method and computer program for remotely testing system components over a network]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/EF8X-L6qUQ8/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447554&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The invention is a turn-key, modular platform, including software and hardware, for testing physical system components such as motors remotely over the Internet. The system allows remote customers to test multiple physical system components under the specific loading conditions of the real-world application. This will provide more detailed and accurate information than what is usually given in the data sheets for system component performance, enabling the user to make a more-reliable ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/EF8X-L6qUQ8" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Expert system reliability assistance for electronics]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/nsR-_KZvd88/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447553&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Methods and systems using one or more expert systems to increase electronic device reliability. One embodiment is a method to screen an electronic device by one or more expert systems to detect a potential failure of the electronic device, selectively testing the electronic device when the screening indicates a potential failure, and providing one or more outputs if the selective testing of the electronic device indicates a failure. A second embodiment is a system to screen an electronic ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/nsR-_KZvd88" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Conditioned medical testing]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/tpWYy-q3_Pw/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447552&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; ; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The invention refers to a computer implemented method, a computer system a test machine and a computer program product for executing conditioned and qualified test. An ordering instance may order a set of tests, comprising an initial test and a set of follow-up tests, wherein the execution of each of the follow-up tests is dependent of the result of the respective predecessor test, like the initial test. The conditions for executing the follow-up tests are dynamically definable and are ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/tpWYy-q3_Pw" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Hard drive assembly tool calibration verification]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/6e8r7nSNAtY/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447551&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An assembly tool is provided. The assembly tool comprises a body and a gripper mount slidably mounted to the body with a first actuator. The first actuator is configured to slide the gripper mount from a first position to a second position along an axis. The assembly tool also comprises a gripper assembly slidably mounted to the gripper mount with a second actuator. The second actuator is configured to facilitate displacement of the gripper assembly with respect to the gripper mount along ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/6e8r7nSNAtY" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Compact fixed-source array test station for calibration of a semi-active laser (SAL) seeker]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/DMmFgUHy5Iw/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447550&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A fixed-source array test station provides a compact cost-effective high-throughput test bed for testing optical sensors that require stimulus at fixed angular positions. An array of fixed collimated sources at different angular positions in the sensor's FOV are positioned on a surface of a focal sphere at the effective focal length of a spherical lens and aligned along respective radial lines to the center of the spherical lens so that each said divergent optical beam is collimated by the ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/DMmFgUHy5Iw" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Tolerance evaluation with reduced measured points]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/q9RdacSkVpc/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447549&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method of determining whether a part satisfies tolerance criteria includes making a multiplicity of measurements of the part, reducing the number of measured points to a number of boundary points that define a boundary within which all measured points are encompassed and comparing the boundary to a tolerance limit of a normal surface to determine whether the part conforms to the ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/q9RdacSkVpc" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Method using time to digital converter for direct measurement of set pulse widths]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/2KWBg18nwMw/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447548&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The disclosure provides for a method for identifying and measuring a signal pulse induced in a microcircuit due to ionizing radiation. The method comprises locating an ionizing radiation induced pulse across a microcircuit using a plurality of sensors on the microcircuit. The method further comprises radiating a radiation through the microcircuit to produce a pulse width. The method further comprises using a time to digital converter (TDC) to measure a duration of the pulse width to create ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/2KWBg18nwMw" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Static noise margin estimation]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/nckmsyRylDY/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447547&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;In a particular embodiment, a method is disclosed that estimates a total static noise margin of a bit cell of a memory. The method includes determining a correlation coefficient of a left static noise margin of the bit cell as compared to a right static noise margin of the bit cell and estimating a total static noise margin of the bit cell by evaluating an analytical function based on the correlation ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/nckmsyRylDY" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Measurement of Fourier coefficients using integrating photometric detector]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/iHEpGFJEyho/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447546&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Provided is a measurement method of Fourier coefficients using an integrating photometric detector, wherein, when measuring an exposure (S&lt;sub&gt;j&lt;/sub&gt;) with a predetermined time interval during a predetermined time period using an integrating photometric detector with respect to light of which amplitude varies with the time period, normalized Fourier coefficients (α′&lt;sub&gt;2n&lt;/sub&gt;, β′&lt;sub&gt;2n&lt;/sub&gt;) for a waveform of an intensity of the light is determined by carrying out a discrete ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/iHEpGFJEyho" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Module for measuring the current flowing in a conductor distribution of a low-voltage distribution board]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/sFyeK4WxamA/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447545&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A module is provided for measuring current flowing in a conductor of a low-voltage distribution board. The module includes a current sensor for detecting the current, a microprocessor circuit for processing an output signal from the current sensor, and a module housing which accommodates the current sensor and the microprocessor circuit. The module housing has an opening for passing the current conductor, an interface with two current connections, and a connection element for releasably ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/sFyeK4WxamA" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Method and apparatus for detecting state of charge of battery]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/8jkQBH-ozik/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447544&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method for detecting a state of charge (SOC) of a battery is disclosed. The method includes inputting a pulse to the battery for receiving a response curve of the battery associated with the pulse inputted to the battery, determining a set of parameters for preparing a simulated curve, comparing a difference between the response curve and the simulated curve, determining whether the difference between the simulated curve and the response curve is less than a predetermined threshold before ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/8jkQBH-ozik" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Electric vehicle simulator and analyzer (EVSA) for electric vehicle supply equipment]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/6q4JhBIo_aw/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447543&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Embodiments pertain to devices and systems having simulator circuitry, particularly to simulator circuitry configured to simulate an electric vehicle and test an electric vehicle charger. A test unit is configured to simulate a GFI current via modulator and to simulate electric vehicle loads via switched and combined resistor loads. The test unit provides for reprogramming of the electric vehicle charger via a pilot line. The test unit self-confirms its usability via associating received ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/6q4JhBIo_aw" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Method and device for measuring the electric power of a universal electric motor powered by sinusoidal alternating voltage]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/6nwWT2Wjlbw/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447542&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method measures the electric power of a universal electric motor (&lt;b&gt;4&lt;/b&gt;) connected to an electric power mains (&lt;b&gt;6&lt;/b&gt;) by a Triac (&lt;b&gt;7&lt;/b&gt;) and supplied by sinusoidal alternating voltage (V(t)). The method determines a first (ton) and a second (toff) instant at which the current (I(t)) supplied to the motor (&lt;b&gt;4&lt;/b&gt;) passes from a zero value to a value other than zero. The current supplied to the motor (&lt;b&gt;4&lt;/b&gt;) at a third instant between the first (ton) and second (toff) instant ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/6nwWT2Wjlbw" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Energy usage monitoring with remote display and automatic detection of appliance including graphical user interface]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/yFOOc2aoMD4/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447541&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Devices and methods for identifying an electrical device, and its state, in a network of electrical devices are disclosed. An energy monitoring device is programmed to identify an electrical device coupled to a power supply, and a state of the electrical device, from a change in successive measurements of the power supply. Algorithms for determining a load signature for an electrical device and its state are disclosed. A stored table of load signatures for states is used to identify ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/yFOOc2aoMD4" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Method for detecting, identifying and locating partial discharges occurring in a discharge site along an electric apparatus]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/WWWJtZtdl1o/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447540&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method for detecting, identifying and locating partial discharges occurring in a discharge site along an electric apparatus comprises the following steps: detecting (1) electrical signals in a detection station; attributing (2) to each detected signal a value of a phase parameter; deriving (3) for each signal at least one shape parameter and one amplitude parameter; separating (4) the set of signals detected into sub sets that are homogeneous relative to the shape parameter; identifying ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/WWWJtZtdl1o" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Electromagnetic field distribution measurement apparatus]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/aSDMoUhvZGc/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447539&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An electromagnetic field distribution measurement apparatus (&lt;b&gt;10&lt;/b&gt;) according to the present invention includes: an electromagnetic field probe (&lt;b&gt;20&lt;/b&gt;) for measuring an electromagnetic field distribution; a scan apparatus (&lt;b&gt;30&lt;/b&gt;) for scanning the vicinity of a wiring (&lt;b&gt;120&lt;/b&gt;) with the electromagnetic field probe (&lt;b&gt;20&lt;/b&gt;); and a data processing apparatus (&lt;b&gt;50&lt;/b&gt;) for calculating the offset value (ΔXd) of the coordinate of the electromagnetic field probe (&lt;b&gt;20&lt;/b&gt;) ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/aSDMoUhvZGc" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Apparatus and methods for monitoring quantities of fluid in a container]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/dGn6CEOHN60/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447538&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The present technology relates to a volumetric measurement device and various methods for operation of the device. The device comprises at least one accelerometer for detecting the angle of tilt/tip of a container. The device also comprises at least one fluid property processor capable of providing at least one fluidic property value of a fluid, a flow-rate processor capable of continuously calculating the present flow rate of the fluid when poured from the container, and a volume processor ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/dGn6CEOHN60" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Methods and apparatus for determining the permeability and diffusivity of a porous solid]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/QktijzacpnA/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447537&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;An apparatus for measuring the permeability and diffusivity of a porous solid includes a device for measuring permeability of the solid; a device for measuring diffusivity of the solid; a sample chamber for holding a sample of the solid, the arrangement being such that the permeability and diffusivity can be measured without removing the sample from the sample ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/QktijzacpnA" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Medium density measuring system]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/Pa0ECkhRLEM/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447536&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A measuring system for the precise measuring a density of a medium, flowing in a line. compressible. The measuring system comprises: a temperature sensor and a pressure sensor. Both sensors communicate with a measuring electronics of the system.&lt;/p&gt;
&lt;p&gt;The measuring electronics are operable to provide, based on temperature measurement and pressure measurement signal, density measured-value representing, instantaneously, a local density, of the flowing medium at a virtual density measuring ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/Pa0ECkhRLEM" height="1" width="1"/&gt;</description>
			         
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			         <title><![CDATA[Wet gas measurement]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/DDX4wmx5mOg/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447535&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A multi-phase process fluid is passed through a vibratable flowtube. Motion is induced in the vibratable flowtube. A first apparent property of the multi-phase process fluid based on the motion of the vibratable flowtube is determined, and an apparent intermediate value associated with the multi-phase process fluid based on the first apparent property is determined. A corrected intermediate value is determined based on a mapping between the intermediate value and the corrected intermediate ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/DDX4wmx5mOg" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8447535/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Digital flowmeter]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/yIgU2xSHPQY/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447534&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A controller for a flowmeter includes an input module operable to receive a sensor signal from a sensor connected to a vibratable flowtube. The sensor signal is related to a fluid flow through the flowtube. The controller also includes a signal processing system operable to receive the sensor signal, determine sensor signal characteristics, and output drive signal characteristics for a drive signal applied to the flowtube. An output module is operable to output the drive signal to the ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/yIgU2xSHPQY" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8447534/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Method of wastewater flow measurement, system analysis, and improvement]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/VxAoKgOqE4I/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447533&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method of reducing rainwater and/or groundwater inflow and infiltration into a wastewater treatment collection grid. The method preferably involves the steps of (a) dividing the grid into a plurality of major subsystems, (b) determining flow depth levels in each major subsystem under dry and wet conditions, (c) using these wet weather and dry weather flow depth measurements to determine a volume flow ratio for wet versus dry conditions, (d) using these flow ratios to identify the ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/VxAoKgOqE4I" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8447533/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Metallic constructions integrity assessment and maintenance planning method]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/1jRMM37z5WE/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447532&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method for metallic structure maintenance is disclosed. The method includes a magneto-graphic/Magnetic Tomography technique to identify stress-related defects. The method is specifically optimized for extended, non-accessible underground and underwater metallic structures in providing quality control, emergency alarms as well as timeline planning for structural repairs and maintenance work. Examples of the method implementation include pipes for oil and gas industry, detection of flaws in ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/1jRMM37z5WE" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8447532/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Device for measuring retention force]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/-Zaj27jCRSI/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447531&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A Centrifugal Adhesion Balance apparatus for measuring retention forces between a body and a surface. This CAB apparatus decouples the normal and lateral retention forces by allowing any combination of the gravity force and a centrifugal force. This CAB apparatus includes a rotatable arm and an independently rotatable flat surface wherein the angle between the arm and the flat surface is precisely ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/-Zaj27jCRSI" height="1" width="1"/&gt;</description>
			         
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<item>
			         <title><![CDATA[High density structural health monitoring system and method]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/wHpvH85WHa0/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447530&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method for monitoring and diagnosing the health of a structure. The method includes providing a plurality of damage monitoring units each having at least one actuator, at least one sensor and a data collection device. The sensors are arranged and disposed to measure vibration produced by the actuator and provide a signal corresponding to the measured vibration to the data collection device. The actuator is activated and the vibration is measured with the sensor. The signal is compared to ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/wHpvH85WHa0" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8447530/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Method and system for predicting corrosion rates using mechanistic models]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/ehHsukfgXCU/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447529&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A computer system and method for predicting the aqueous phase CO&lt;sub&gt;2 &lt;/sub&gt;corrosion rate of a pipe useful in the production and transportation of oil and gas. Input parameter values corresponding to water chemistry and physical fluid and pipe properties are received. Based on these input parameter values, the system and method derive current-voltage relationships for multiple cathodic reduction reactions according to an electrochemical model of the corrosion reaction, and a ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/ehHsukfgXCU" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8447529/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Remote vehicle emissions sensing system and method for differentiating water from hydrocarbons]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/c7ycs2HUyjw/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447528&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Water droplets in exhaust gas that is, or was, analyzed by a remote emissions sensing system are detected. The detection may be made using measurements generally captured by the remote emissions sensing system during typical operation. As such, the detection may be applied “on site” as remote emissions sensing analysis is ongoing, or may be applied post hoc from data previously acquired by a remote emissions sensing system. The detection may be implemented without requiring additional ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/c7ycs2HUyjw" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8447528/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Methods and apparatus for performing retention-time matching]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/Bwph9N2QFsw/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447527&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method for matching a precursor ion with one or more related product ions includes providing input data sets obtained from sample injections, each of the data sets including a precursor ion and one or more product ions, normalizing the input data sets in accordance with a single retention time for the precursor ion, determining which product ions are within a predetermined retention time window with respect to the single retention time, and, if a product ion is within the predetermined ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/Bwph9N2QFsw" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8447527/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Methods and computer systems for analyzing high-throughput assays]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/-FH-AnL65ZI/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447526&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;The present invention provides methods and computer programs for detecting variations in measurements of a biological variable, e.g., variations in cell viability, under different conditions, e.g., with or without treatment of a drug, under the treatments of different drugs, or under different environmental conditions. The methods and programs of the invention determine a metric of difference between measurements under different condition, and make use of predetermined errors of the ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/-FH-AnL65ZI" height="1" width="1"/&gt;</description>
			         
			         <guid isPermaLink="false">8447526</guid>
			
			      <feedburner:origLink>http://www.patentstorm.us/patents/8447526/description.html</feedburner:origLink></item>
<item>
			         <title><![CDATA[Interactive structural restoration while interpreting seismic volumes for structure and stratigraphy]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/QRCWdsc-DoA/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447525&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; ; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method for performing seismic interpretation of a subterranean formation by enabling dual-domain interpretation of seismic features in the present day depth domain and simultaneously in a structurally restored “mapped” seismic domain. Specifically, seismic interpretation is performed on structurally restored seismic volumes while concurrently viewing the interpretation results in the structural domain. This increases the interpretation confidence by improved correlation of structural ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/QRCWdsc-DoA" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8447525/description.html</feedburner:origLink></item>
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			         <title><![CDATA[Method for geophysical and geological interpretation of seismic volumes using chronological panning]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/WKplqWpq_tk/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447524&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A computer-implemented method is provided for searching and analyzing a seismic data volume acquired in a seismic survey to determine potential for hydrocarbon accumulations in an associated subsurface region. Surfaces describing the seismic data volume are obtained. The surfaces are enumerated. At least one enumerated surface is selected. The at least one selected surface is augmented when the selected surface does not substantially cover an area associated with the seismic data volume. ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/WKplqWpq_tk" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8447524/description.html</feedburner:origLink></item>
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			         <title><![CDATA[High speed data transfer for measuring lithology and monitoring drilling operations]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/7W8iNKtIvxc/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447523&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventors:&lt;/strong&gt; &amp;nbsp;; &lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A system for determining at least one of a lithology of a formation traversed by a borehole and an operational condition of a component of a drill string disposed in the borehole is disclosed. The system includes a drill string with a high speed wired pipe telemetry system for transmitting downhole measurements made by a sensor to a computer processing system in real time. The computer processing system is external to the drill string and includes a model that models operation of the drill ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/7W8iNKtIvxc" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8447523/description.html</feedburner:origLink></item>
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			         <title><![CDATA[Method for estimating the probability of collision between wells]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/3IjuA5L1DVE/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447522&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;A method for drilling a well, the method including: identifying another well proximate to the well being drilled; collecting spatial information for at least a portion of the another well and the well being drilled; estimating a trajectory for at least a portion of the well being drilled and the another well; estimating an uncertainty in spatial information for each trajectory; estimating a probability of a collision with the another well during the drilling of the well by integrating a ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/3IjuA5L1DVE" height="1" width="1"/&gt;</description>
			         
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			      <feedburner:origLink>http://www.patentstorm.us/patents/8447522/description.html</feedburner:origLink></item>
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			         <title><![CDATA[Subsurface electrical conductivity contrast reconstruction using narrow-band electromagnetic data and fullwave imaging]]></title>
			         <link>http://feedproxy.google.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~3/92nxLutwNgQ/description.html</link>
			         <description>&lt;ul&gt;&lt;li&gt;&lt;strong&gt;Patent Number:&lt;/strong&gt; &amp;nbsp;8447521&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Publication Date:&lt;/strong&gt; &amp;nbsp;2013-05-21&lt;/li&gt;&lt;li&gt;&lt;strong&gt;Inventor:&lt;/strong&gt; &amp;nbsp;&lt;/li&gt;&lt;/ul&gt;
&lt;p&gt;Methods and related systems are described for analyzing electromagnetic survey data. Electromagnetic survey data of a subterranean formation is obtained using at least a downhole transceiver deployed in a borehole and a transceiver positioned on the surface or in another borehole. The electromagnetic survey data includes an incident wave component and a scattered wave component. The incident and scattered components are correlated so as to generate an image of the subterranean formation ...&lt;br /&gt;&lt;img src="http://feeds.feedburner.com/~r/Patentstorm-Patents-DataProcessingMeasuringCalibratingOrTesting/~4/92nxLutwNgQ" height="1" width="1"/&gt;</description>
			         
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</channel>
		</rss>
